Joseph S Ross

US Patent:

6906808, Jun 14, 2005

Filed:

May 30, 2002

Appl. No.:

10/160532

Inventors:

Richard L. Trantow - Denoe Bay OR, US
Joseph B. Ross - Cincinnati OH, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01B011/24

US Classification:

356601

Abstract:

A method enables a surface contour of an object to be measured using an optical system. The method includes positioning the object in a measurement cell, filling the cell with fluid, transmitting light towards the object in the measurement cell, measuring the illumination of a surface of the object, generating an image of the object based on the illumination of the surface.

US Patent:

6985238, Jan 10, 2006

Filed:

Sep 25, 2002

Appl. No.:

10/065192

Inventors:

Ralph Gerald Isaacs - Cincinnati OH, US
John Charles Janning - Cincinnati OH, US
Francis Howard Little - Cincinnati OH, US
James Robert Reinhardt - Okeana OH, US
Joseph Benjamin Ross - Cincinnati OH, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01B 11/24

US Classification:

356601, 356613, 702155, 702167

Abstract:

A non-contact measurement system employing a non-contact optical sensor and an edge detection sensor with a positioning system for moving the sensors over the surface and edges of a part (A) held in a predetermined, fixed position. The part is aligned in a co-ordinate system for obtaining accurate measurements of the part's surface (S) and edges (E). For parts smaller than the optical sensor's field of view, the part is rotated about an axis so both sides of the part are viewed by the sensor. If required, the part can also be shifted linearly along a horizontal axis (X) parallel to the sensor. For parts larger in size than the sensor's field of view, the part is moved along a vertical axis (Y) in predetermined segments so all of the part is exposed to viewing by the sensor.

US Patent:

7327857, Feb 5, 2008

Filed:

Mar 9, 2004

Appl. No.:

10/797329

Inventors:

Joseph Benjamin Ross - Cincinnati OH, US
Glen William Brooksby - Glenville NY, US
Van-Duc Nguyen - Pleasanton CA, US
John Lewis Schneiter - Latham NY, US
Steven Jeffrey Gordon - Weston MA, US
Victor Nzomigni - Rennes Cedex, FR
Donald Hamilton - Burnt Hills NY, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G06K 9/00

US Classification:

382106, 382152, 382154

Abstract:

A non-contact imaging apparatus for examining an object having complex surfaces or shape deformations. The imaging apparatus includes at least one imaging device for obtaining a scanned image of the exterior surfaces of the object being examined. A predetermined reference image) of an ideal model for the object is stored in a memory. An image register is coupled to the imaging device and to the memory containing the reference image of the ideal model for the object. A transformation estimator compares the scanned image to the reference image and provides a transform which maps the scanned image to the reference image and provides a set of registered object data points. One or more filter modules process the registered object data points with a priori information to reduce noise and to further enhance the accuracy and precision of the registration. A gauge estimator is coupled to the filter module. The gauge estimator utilizes the processed and registered object data to determine deformation parameters of the object, which are then displayed to an operator as gauging information.

US Patent:

20170038199, Feb 9, 2017

Filed:

Aug 7, 2015

Appl. No.:

14/820640

Inventors:

- Schenectady NY, US
Joseph Benjamin Ross - Cincinnati OH, US
Esmaeil Heidari - Schenectady NY, US

International Classification:

G01B 11/27
G01N 21/956

Abstract:

A method involves receiving a test image of at least a portion of a test object which includes a test moiré pattern generated by superposing one or more reference gratings on one or more subject gratings. The method further involves analyzing one or more test beat lines in the test moiré pattern and calculating one or more test values based on the analysis of the one or more test beat lines. The one or more test values are a function of one or more rotational angles corresponding to the one or more subject gratings and a shape of at least the portion of the test object. The method also involves calculating one or more angular errors of the one or more subject gratings based on the one or more test values and one or more template values and sending a notification based on the one or more angular errors.