Min-Chung Jon - Princeton Junction NJ Douglas Charles Smith - Rumson NJ Joseph Charles Veshinfsky - Catasauqua PA
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
H05F 302 G01N 2518
US Classification:
361220
Abstract:
Electrostatic discharge during thermal shock testing on an electronic device (12) by alternate immersion in hot and cold baths (14, 16) of a fully-fluorinated liquid (20) can be reduced by carrying the device within a first, electrically conductive, open-weave basket (32) enclosed within, and coupled to a second basket (30) of similar construction, but a looser weave. The first basket acts as a Faraday shield about the electronic device when both baskets are alternately immersed in the hot and cold baths.
Technique For Increasing Oxygen Incorporation During Silicon Czochralski Crystal Growth
David L. Johnson - Bethlehem PA Robert J. Lavigna - Bath PA Wen Lin - Allentown PA Raymond J. Newman - Hopewell NJ Subramani Rajaram - Flanders NJ Joseph C. Veshinfsky - Whitehall PA George Williams - Mercerville NJ
International Classification:
C30B 1510
US Classification:
1566171
Abstract:
A glass crucible (30) for containing a material from which a silicon crystal melt is produced, wherein the inside surface area of the crucible is increased to react with the silicon melt (31) to increase the oxygen content thereof. The inside surface area may be increased by incorporating inwardly directed silica ribs (40) or concentric, hollow silica cylinders (32) as well as forming corrugations (45) or undulations on the inside surface thereof.