Joydeep Banerjee

US Patent:

20130346594, Dec 26, 2013

Filed:

Jun 25, 2012

Appl. No.:

13/531616

Inventors:

Joydeep Banerjee - Rancho Palos Verdes CA, US
Paul A. Wojciak - Poughkeepsie NY, US

Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY

International Classification:

G06F 15/173

US Classification:

709224

Abstract:

Mechanisms are provided for determining threshold conditions for performing operations within a performance monitoring tool. Metric data is collected from a computing system environment and clustering analysis is performed on the metric data to generate a plurality of clusters. One or more candidate clusters are selected that are candidate clusters for generating a threshold condition for performance monitoring. At least one threshold condition for performance monitoring is generated based on a composition of the selected one or more candidate clusters. The at least one threshold condition is then applied to future performance metric data to determine whether to perform an operation in response to the future performance metric data meeting or not meeting the at least one threshold condition.