Kai Xin

Address:

41 Indian Pipe Dr, Wynantskill, NY 12198

Phone:

5186183056

VIN:

2C4RC1BG3CR188523

Make:

CHRYSLER

Model:

TOWN AND COUNTRY

Year:

2012

US Patent:

8050382, Nov 1, 2011

Filed:

Feb 24, 2009

Appl. No.:

12/391677

Inventors:

Zewu Chen - Schenectady NY, US
Rory Delaney - Burnt Hills NY, US
Kai Xin - Wynantskill NY, US

Assignee:

X-Ray Optical Systems, Inc. - East Greenbush NY

International Classification:

G01N 23/223

US Classification:

378 47

Abstract:

An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream suspended in the space and streaming through the focal area, using a laminar air flow and/or pressure to define the stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.

US Patent:

8559597, Oct 15, 2013

Filed:

Mar 3, 2009

Appl. No.:

12/920641

Inventors:

Zewu Chen - Schenectady NY, US
David M. Gibson - Voorheesville NY, US
Walter M. Gibson - Voorheesville NY, US
Adam Bailey - Albany NY, US
R. Scott Semken - Lappeenranta, FI
Kai Xin - Wynantskill NY, US
John H. Burdett - Scotia NY, US

Assignee:

X-Ray Optical Systems, Inc. - East Greenbush NY

International Classification:

G21K 1/06

US Classification:

378 85, 378121

Abstract:

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e. g. , manufactured products including toys and electronics.

US Patent:

8625737, Jan 7, 2014

Filed:

Feb 8, 2011

Appl. No.:

13/023111

Inventors:

Zewu Chen - Schenectady NY, US
Sony Cheriyan - Jersey City NJ, US
Kai Xin - Wynantskill NY, US
Jay Burdett - Scotia NY, US

Assignee:

X-Ray Optical Systems, Inc. - East Greenbush NY

International Classification:

G01N 23/223
G01N 21/01
H05G 1/02

US Classification:

378 44, 378 47, 378208

Abstract:

An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.

US Patent:

20090225948, Sep 10, 2009

Filed:

Mar 4, 2009

Appl. No.:

12/397504

Inventors:

Adam BAILEY - Albany NY, US
Zewu CHEN - Schenectady NY, US
R. Scott SEMKEN - East Greenbush NY, US
Kai XIN - Wynantskill NY, US

Assignee:

X-RAY OPTICAL SYSTEMS, INC. - East Greenbush NY

International Classification:

G21K 1/06

US Classification:

378 85, 378 84

Abstract:

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.

US Patent:

20170110212, Apr 20, 2017

Filed:

Oct 26, 2016

Appl. No.:

15/334886

Inventors:

- East Greenbush NY, US
Rory D. DELANEY - Slingerlands NY, US
John H. BURDETT - Charlton NY, US
Kai XIN - Wynantskill NY, US

Assignee:

X-RAY OPTICAL SYSTEMS, INC. - East Greenbush NY

International Classification:

G21K 1/06

Abstract:

A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.

US Patent:

20160260514, Sep 8, 2016

Filed:

May 16, 2016

Appl. No.:

15/155575

Inventors:

- East Greenbush NY, US
David M. GIBSON - Voorheesvill NY, US
Walter M. GIBSON - Voorheesville NY, US
Adam BAILEY - Albany NY, US
R. Scott SEMKEN - Lappeenranta, FI
Kai XIN - Wynantskill NY, US

Assignee:

X-RAY OPTICAL SYSTEMS, INC. - East Greenbush NY

International Classification:

G21K 1/06
G01N 23/223
G01N 23/20

Abstract:

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.

US Patent:

20150262722, Sep 17, 2015

Filed:

Jun 1, 2015

Appl. No.:

14/727027

Inventors:

- East Greenbush NY, US
David M. GIBSON - Vorheesville NY, US
Walter M. GIBSON - Vorheesville NY, US
Adam BAILEY - Albany NY, US
R. Scott SEMKEN - Lappeenranta, FI
Kai XIN - Wynantskill NY, US

Assignee:

X-RAY OPTICAL SYSTEMS, INC. - East Greenbush NY

International Classification:

G21K 1/06
G01N 23/20
H05G 1/04

Abstract:

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.

US Patent:

20140294157, Oct 2, 2014

Filed:

Oct 25, 2012

Appl. No.:

14/128078

Inventors:

- East Greenbush NY, US
Rory D. Delaney - Slingerlands NY, US
John H. Burdett - Charlton NY, US
Kai Xin - Wynantskill NY, US

Assignee:

X-RAY OPTICAL SYSTEMS, INC. - East Greenbush NY

International Classification:

G21K 1/06

US Classification:

378145

Abstract:

A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.