Karl Jacob Yoder

age ~49

from Rockwall, TX

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Also known as:

Karl J Yoder
Jacob Yoder

Phone and address:: 1021 Calm Crest Dr, Rockwall, TX 75087

Connected to:

Karl Yoder Phones & Addresses

1021 Calm Crest Dr, Rockwall, TX 75087
3301 Fm 1417, Sherman, TX 75092 • 9038928006
910 Bond St, Denison, TX 75020 • 9034652801
Elkview, WV
Mohrsville, PA
University Park, PA
910 W Bond St, Denison, TX 75020 • 9034916225

Work

Company:

Texas instruments, inc
Oct 2008
Position:

Section manager, plasma / thin film

Education

School / High School:

The University of North Texas- Denton, TX
1999
Specialities:

MS in Materials Science

Emails

k***[email protected]

Us Patents

Method Of Increasing Mechanical Properties Of Semiconductor Substrates
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US Patent:

20040018392, Jan 29, 2004
Filed:

Jul 26, 2002
Appl. No.:

10/206005
Inventors:

Karl Yoder - Denison TX, US
Assignee:

Texas Instruments Incorporated - Dallas TX
International Classification:

B32B009/00
US Classification:

428/698000, 428/336000, 428/701000, 257/077000, 427/126100
Abstract:

Semiconductor wafers exhibiting increased mechanical strength and reduced susceptibility to fracture and methods of making the same are disclosed. The improved mechanical strength arises from a thin coating of a refractory material deposited on the backside of the wafer. Preferably, the coating is comprised of a ceramic. More preferably, the coating is comprised of silicon carbide. Also disclosed are methods for evaluating different coating materials.

Method Of Increasing Mechanical Properties Of Semiconductor Substrates
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US Patent:

20040110013, Jun 10, 2004
Filed:

Nov 7, 2003
Appl. No.:

10/703803
Inventors:

Karl Yoder - Denison TX, US
Bradley Sucher - McKinney TX, US
International Classification:

B32B009/04
US Classification:

428/446000
Abstract:

Semiconductor wafers exhibiting increased mechanical strength and reduced susceptibility to fracture and methods of making the same are disclosed. The improved mechanical strength arises from a thin coating of a refractory material deposited on the backside of the wafer. Preferably, the coating is comprised of a ceramic. More preferably, the coating is comprised of silicon carbide. Also disclosed are methods for evaluating different coating materials.

License Records

Karl R. Yoder

License #:

1303 - Expired

Issued Date:

Jan 16, 1987

Renew Date:

Feb 28, 1989

Expiration Date:

Feb 28, 1989

Type:

Residential Wireman

Resumes

Dmos5 Section Manager, Plasma Equipment Engineering

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Location:

1021 Calm Crest Dr, Rockwall, TX 75087

Industry:

Semiconductors

Work:

Texas Instruments
Dmos5 Section Manager, Plasma Equipment Engineering
Kinetics Jan 1995 - Aug 1995
Co-Op Engineer
Dietrich's Milk Products May 1994 - Aug 1994
Engineering Intern

Education:

University of North Texas 1999 - 2002
Master of Science, Masters, Materials Science Penn State University 1993 - 1997
Bachelors, Bachelor of Science, Chemical Engineering Schuylkill Valley High School
Pennsylvania State University

Skills:

Semiconductors
Thin Films
Characterization
Fib
Materials Science
Manufacturing
Nanotechnology
Design of Experiments
Yield
Lean Manufacturing
Electronics
Process Integration
Spc
Failure Analysis
Jmp
Process Engineering
Silicon
Engineering
Semiconductor Industry
Plasma Etch
Pvd
Cmos

Karl Yoder

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Karl Yoder Sherman, TX

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Work:

Texas Instruments, Inc

Oct 2008 to 2000
Section Manager, Plasma / Thin Film Texas Instruments, Inc.
Sherman, TX
Aug 2004 to Sep 2008
Wafer Fab Engineer, MGTS Texas Instruments, Inc.
Sherman, TX
Jan 1998 to Jul 2004
Fab Quality Engineer

Education:

The University of North Texas
Denton, TX
1999 to 2002
MS in Materials Science The Pennsylvania State University
University Park, PA
1993 to 1997
BS in Chemical Engineering