Keith J Davis

US Patent:

6483590, Nov 19, 2002

Filed:

Dec 18, 2000

Appl. No.:

09/740316

Inventors:

Keith J. Davis - Seattle WA

Assignee:

The Boeing Company - Chicago IL

International Classification:

G01N 2155

US Classification:

356445, 356446, 356600

Abstract:

A reflectometer characterizes the reflectance properties of a test material. The reflectometer includes a radiation subsystem that generates and directs radiation onto a test material at a plurality of incident angles. An elliptical reflector assembly has one or more reflectors with a first and second foci. A holder positions the test material at the first focus of the reflectors. One or more lenses are located within a first focal length of the second focus of the reflectors. The lenses receive a first angular image that is reflected by the reflector. The holder is rotatable relative to the radiation subsystem. Stepper motors and encoders vary the angular position of the incident angle and an azimuth angle of the test material. A computer records an angular image for each azimuth and incident angle to completely characterize the reflectance properties of the test material.

US Patent:

6982794, Jan 3, 2006

Filed:

Jun 9, 1997

Appl. No.:

08/871305

Inventors:

Keith J. Davis - Issaquah WA, US
Diane C. Rawlings - Bellevue WA, US

Assignee:

The Boeing Company - Chicago IL

International Classification:

G01N 21/47
G01J 5/02

US Classification:

356446, 356 51, 25033911, 2503418

Abstract:

The present invention is a directional reflectometer that measures, for example, the optical bidirectional reflectance distribution function [BRDF] of a surface in situ on a finished article, e. g. a vehicle, to provide information on its surface reflectivity and emissivity. The light wavelength may be IR, near-IR, visible, UV, or longer wavelengths. Light, preferably focused to a small spot on the surface, is projected onto the surface at an angle adjustable in azimuth and elevation. A wide angle mirror, lens system, or both transfers light scattered from the surface onto an imaging sensor, preserving scattering angle information and thereby permitting the BRDFs for a given incidence angle and all scattering angles to be measured simultaneously. A computer reads the sensor outputs and analyzes the quality of the surface in a factory or field environment.

US Patent:

7598506, Oct 6, 2009

Filed:

Dec 22, 2006

Appl. No.:

11/615043

Inventors:

Stephen K. Wilcken - Des Moines WA, US
Keith J. Davis - Seattle WA, US

Assignee:

The Boeing Company - Chicago IL

International Classification:

G01J 3/00

US Classification:

2504931, 2504951, 2505031, 250504 R

Abstract:

An adjustable, low-temperature blackbody radiation system includes a blackbody enclosure having an optical port formed therein, and a cold element provided within the blackbody enclosure adjacent the optical port, the cold element configured to emit thermal radiation through the optical port. A dry gas source is in fluid communication with the blackbody enclosure, and is configured to purge the blackbody enclosure with a gas. A temperature control system is coupled to the cold element to maintain the cold element at a predetermined temperature. A light trap feature (e. g. , a dark mirror cube corner structure) is incorporated into and/or around the cold element.

US Patent:

7955858, Jun 7, 2011

Filed:

Dec 16, 2008

Appl. No.:

12/335724

Inventors:

Keith J. Davis - Seattle WA, US
Nicole L. Dehuff - Seattle WA, US
Morteza Safai - Seattle WA, US

Assignee:

The Boeing Company - Chicago IL

International Classification:

G01N 21/64

US Classification:

436164, 436165, 436172, 422400, 422425, 422430, 422 681, 422 8205, 422 8207, 422 8208

Abstract:

A detection method and indicator are disclosed that includes quantum dots that fluoresce under illumination of a first light having a first wavelength to indicate the presence of a predetermined condition, and in particular, a corrosion condition. The quantum dots are surrounded by a shell material that under normal conditions reflect the first light and reacts in the presence of the predetermined condition to permit the first light to illuminate the quantum dot to excite the quantum dot to emit a second light having a second wavelength, which when detected, indicates the presence of the predetermined condition.

US Patent:

8568854, Oct 29, 2013

Filed:

Dec 15, 2010

Appl. No.:

12/968557

Inventors:

Keith J. Davis - Seattle WA, US
Michael P. Kozar - Mercer Island WA, US
Mark S. Wilenski - Mercer Island WA, US

Assignee:

The Boeing Company - Chicago IL

International Classification:

B32B 5/12
B29C 65/00

US Classification:

428113, 428105

Abstract:

A composite article has an article surface and may comprise a plurality of fibers at least partially embedded in a matrix. Each fiber may have at least one base surface and a pair of side surfaces. The side surfaces may be oriented in non-perpendicular relation to the base surface. The fibers may be positioned in side-by-side relation to one another such that the side surfaces of each fiber are oriented substantially parallel to the side surfaces of the immediately adjacent fibers.

US Patent:

20030133121, Jul 17, 2003

Filed:

Jan 3, 2003

Appl. No.:

10/336938

Inventors:

Keith Davis - Issaquah WA, US
Diane Rawlings - Bellevue WA, US

Assignee:

The Boeing Company

International Classification:

G01N021/55

US Classification:

356/445000

Abstract:

The present invention is a directional reflectometer that measures, for example, the optical bidirectional reflectance distribution function [BRDF] of a surface in situ on a finished article, e.g. a vehicle, to provide information on its surface reflectivity and emissivity. The light wavelength may be IR, near-IR, visible, UV, or longer wavelengths. Light, preferably focused to a small spot on the surface, is projected onto the surface at an angle adjustable in azimuth and elevation. A wide angle mirror, lens system, or both transfers light scattered from the surface onto an imaging sensor, preserving scattering angle information and thereby permitting the BRDFs for a given incidence angle and all scattering angles to be measured simultaneously. A computer reads the sensor outputs and analyzes the quality of the surface in a factory or field environment.

US Patent:

20110176962, Jul 21, 2011

Filed:

Mar 23, 2011

Appl. No.:

13/070046

Inventors:

Keith J. DAVIS - Seattle WA, US
Nicole L. DEHUFF - Seattle WA, US
Morteza SAFAI - Seattle WA, US

Assignee:

THE BOEING COMPANY - Chicago IL

International Classification:

G01N 21/75
G01N 21/76
B82Y 5/00

US Classification:

422 52, 436172, 977774

Abstract:

A detection method and indicator are disclosed that includes quantum dots that fluoresce under illumination of a first light having a first wavelength to indicate the presence of a predetermined condition, and in particular, a corrosion condition. The quantum dots are surrounded by a shell material that under normal conditions reflect the first light and reacts in the presence of the predetermined condition to permit the first light to illuminate the quantum dot to excite the quantum dot to emit a second light having a second wavelength, which when detected, indicates the presence of the predetermined condition.

US Patent:

20130170020, Jul 4, 2013

Filed:

Jan 3, 2012

Appl. No.:

13/342723

Inventors:

Keith J. Davis - Seattle WA, US

International Classification:

G02B 5/00

US Classification:

359350

Abstract:

Apparatus and methods to provide a surface having a tunable emissivity are disclosed. An example apparatus includes an impedance layer comprising a layer of dielectric material to be attached to an electrically reflective ground plane, and a plurality of resonators arranged within the impedance layer, wherein an emissivity of the apparatus is based on a characteristic of the resonators.