Kenneth Lee Kump

US Patent:

7315026, Jan 1, 2008

Filed:

Feb 22, 2005

Appl. No.:

11/063909

Inventors:

James Z. Liu - Glenview IL, US
Olgun Kukrer - Waukesha WI, US
Kenneth S. Kump - Waukesha WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01T 1/24

US Classification:

25037009

Abstract:

Certain embodiments of the present invention include a method, system, and apparatus for improved stabilization in solid state x-ray detectors. A method for detecting x-rays includes providing a top layer including an exterior surface and interior surface. The interior surface of the top layer is substantially electrically non-dissipative. The method also includes providing an electrical ground path and an electrically dissipative layer adjacent to the interior surface of the top layer. The electrically dissipative layer is capable of facilitating discharge of static charge from the interior surface of the top layer to the electrical ground path.

US Patent:

7324628, Jan 29, 2008

Filed:

Aug 4, 2005

Appl. No.:

11/197029

Inventors:

James Zhengshe Liu - Glenview IL, US
Olgun Kukrer - Waukesha WI, US
Kenneth Scott Kump - Waukesha WI, US
Jon C. Omernick - Wauwatosa WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

H05G 1/54
G01N 23/04

US Classification:

378117, 378 988, 378207

Abstract:

A method of testing a portable x-ray device includes sensing an environmental stimulus experienced by the portable x-ray device, transmitting a signal related to the environmental stimulus to a processing unit, determining whether the signal meets an alert threshold, activating a detector of the portable x-ray device if the signal meets the alert threshold, producing a gray image through the activating step, comparing the gray image produced through the activating step with a control gray image corresponding to a properly functioning detector.

US Patent:

7649979, Jan 19, 2010

Filed:

May 21, 2008

Appl. No.:

12/124355

Inventors:

James Zhengshe Liu - Glenview IL, US
Tiantian Zhang - Waukesha WI, US
Kenneth Scott Kump - Waukesha WI, US
Jingyi Liang - Brookfield WI, US
Chuande Liu - Waukesha WI, US
Kadri Nizar Jabri - Waukesha WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

H05G 1/64

US Classification:

378 9811, 378207

Abstract:

The effects of electromagnetic interference (EMI) on X-ray image data is corrected by characterizing the EMI and processing the image data to subtract the EMI effects from the image data. The X-ray image data, along with offset data, are collected in a conventional manner, affected by EMI if present, and EMI-characterizing data is immediately collected thereafter by disabling rows of a digital detector (FET off). The EMI-characterizing data, then, is not affected by the presence of image data, and can be used to characterize the amplitude and frequency of the EMI. The EMI-characterizing data is assured of being in phase with the collected image and offset data due to its collection in the same image acquisition sequence immediately following the collection of image and offset data. Artifacts due to the presence of EMI are thus eliminated from reconstructed images based upon the corrected data.

US Patent:

7745797, Jun 29, 2010

Filed:

Mar 3, 2009

Appl. No.:

12/396730

Inventors:

James Zhengshe Liu - Glenview IL, US
Chen Zhang - Beijing, CN
Habib Vafi - Brookfield WI, US
Zhimin Sun - Beijing, CN
Kenneth Scott Kump - Waukesha WI, US
Clifford Bueno - Clifton Park NY, US

Assignee:

General Electric Co. - Schenectady NY

International Classification:

H01L 27/146
G01T 1/20

US Classification:

25037009

Abstract:

A digital radiography imaging system having a digital x-ray detector that is easy to manufacture and produces high quality images with no artifacts. The digital x-ray detector including a front cover, a scintillator screen member, a light imager panel member having a surface in direct contact with an adjoining surface of the scintillator screen member, a compressible member positioned between the front cover and the scintillator screen member to apply pressure to the scintillator screen member and the adjoining surface between the scintillator screen member and the light imager panel member, electronic circuitry mounted on at least one printed circuit board and coupled to the light imager panel, a back cover, and a plurality of fasteners for fastening the front cover to the back cover.

US Patent:

7973288, Jul 5, 2011

Filed:

Mar 18, 2007

Appl. No.:

11/687661

Inventors:

James Zhengshe Liu - Glenview IL, US
Kenneth Scott Kump - Waukesha WI, US
Habib Vafi - Brookfield WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01J 1/42
G01T 1/00
G08B 17/12

US Classification:

250395, 2503541, 340600

Abstract:

A method includes purposefully electromagnetically shielding a portable x-ray detector.

US Patent:

8217358, Jul 10, 2012

Filed:

Dec 14, 2009

Appl. No.:

12/637069

Inventors:

James Zhengshe Liu - Glenview IL, US
Feng Gao - Naperville IL, US
Kenneth Scott Kump - Waukesha WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01T 1/20

US Classification:

25037009

Abstract:

A system and method for eliminating image artifacts caused by electromagnetic interference (EMI) on a digital x-ray detector. The system and method includes a digital x-ray detector panel having an array of pixels in rows and columns, with a plurality of data lines coupled to the columns of pixels and a plurality of scan lines coupled to the rows of pixels. The system and method uses certain photodiodes in a row of the pixel array for measuring EMI with corresponding scan line and FETs deactivated and eliminating the EMI and image artifacts with the remaining photodiodes in the row with corresponding scan line and FETs activated.

US Patent:

8396188, Mar 12, 2013

Filed:

Jan 21, 2011

Appl. No.:

13/011016

Inventors:

James Zhengshe Liu - Glenview IL, US
Paul Richard Granfors - Berkeley CA, US
Kenneth Scott Kump - Waukesha WI, US
Ping Xue - Pewaukee WI, US
Donald Fayette Langler - Brookfield WI, US
Brian John Kost - Waukesha WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01N 23/04

US Classification:

378 62, 378 988

Abstract:

An X-ray imaging method includes performing an X-ray exposure via an X-ray radiation source responsive to a source controller. The method also includes sampling X-ray image data via a digital detector without communication of timing signals from the source controller. The method further includes combining the sampled X-ray image data of at least one imaging frame or two or more imaging frames with at least one of the frames spanning a duration in which the exposure occurred, to produce X-ray image data capable of being reconstructed into a user-viewable image.

US Patent:

8421014, Apr 16, 2013

Filed:

Jun 9, 2011

Appl. No.:

13/156514

Inventors:

James Zhengshe Liu - Glenview IL, US
Kenneth Scott Kump - Waukesha WI, US
Habib Vafi - Brookfield WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01T 1/00
H01L 27/146

US Classification:

2503361, 25037009

Abstract:

A portable x-ray detector is disclosed that includes an x-ray detecting member and a user removable electromagnetic interference (EMI) shielding member. The user removable EMI shielding member is positioned to at least partially magnetically shield the x-ray detecting member of the portable x-ray detector by redirecting an impinging magnetic field around the x-ray detecting member. The user removable EMI shielding member includes a first magnetic shielding layer, a second magnetic shielding layer, and an intervening material, other than the x-ray detecting member, between the first magnetic shielding layer and the second magnetic shielding layer.