Kevin D Bittick

US Patent:

20050010842, Jan 13, 2005

Filed:

Jul 8, 2003

Appl. No.:

10/614997

Inventors:

Dennis Burke - Allen TX, US
Mark Erickson - Richardson TX, US
Kevin Bittick - Dallas TX, US

International Classification:

G01R031/28

US Classification:

714724000

Abstract:

The present application describes a system and method for testing semiconductor devices and specifically for testing mixed signal semiconductor devices. The test systems are configured to test the semiconductor devices using overlapping test setups by configuring various test system elements. The various test system elements are programmed and prepared for subsequent tests concurrently with tests executing on the semiconductor devices. The test results are computed by various software computation modules configured to independently execute in parallel with the subsequent tests. The resultant test data of an executed test is shared among the various concurrently executing software computation modules using shared information storage. A tester user interface, executing on test system, provides an interface between user test scripts and software computation modules. Therefore, separating complex computations and data compilation from test execution in the test system results in significantly faster and efficient semiconductor device testing.

US Patent:

20070038851, Feb 15, 2007

Filed:

Aug 12, 2005

Appl. No.:

11/203501

Inventors:

Amit Babaria - Grapevine TX, US
Kevin Bittick - Dallas TX, US
Dennis Burke - Allen TX, US
Chen-Yi Su - Dallas TX, US

International Classification:

G06F 15/177

US Classification:

713001000

Abstract:

A method for programming secure data into nonvolatile memory in an IC is disclosed. The method includes steps for loading the secure data into temporary memory, temporarily disabling tester logging functions, and loading the secure data from temporary memory to the nonvolatile memory of the device. Further steps include verifying that the secure data is correctly loaded into the nonvolatile memory of the IC and implementing protection for the programmed secure data to prevent access subsequent to programming. Aspects of the invention include the selection or modification of patterns for programming secure data into nonvolatile memory. Temporary memory containing secure data and/or modified patterns is erased. The programming and protecting steps take place within a single instruction to the TOS so that the user does not regain access to the IC until the secure data is protected within the IC.