Kevin J Meyer

US Patent:

7648681, Jan 19, 2010

Filed:

Dec 1, 2004

Appl. No.:

11/001623

Inventors:

Kevin Jon Meyer - Cincinnati OH, US
Betty Jo Smith - Batavia OH, US

Assignee:

Meridian Bioscience, Inc. - Cincinnati OH

International Classification:

B01L 3/00

US Classification:

422102, 422 58, 422104, 49146, 49162, 49177, 222557

Abstract:

A system for collecting, transporting and preparing a fecal specimen for examination includes a container, a closure selectively secured over an open end of the container, and a sample collection member coupled to the closure and extending into the container when the closure is secured thereto. In one embodiment, the closure includes a base and a cap that are hingedly coupled together. The cap is selectively moveable between a closed position that seals an aperture in the base, and an open position wherein the aperture is exposed to permit expelling contents of the container through the aperture. In another embodiment, the closure comprises a base having a spout and an aperture, and a cap coupled to the base for axial movement along the spout between open and closed positions. The system may further include a deodorant to mask or absorb odors.

US Patent:

7924439, Apr 12, 2011

Filed:

Apr 6, 2009

Appl. No.:

12/419051

Inventors:

Tian Chen - Shanghai, CN
Kevin George Harding - Niskayuna NY, US
Steven Robert Hayashi - Niskayuna NY, US
Xiaoming Du - Shanghai, CN
Jianming Zheng - Shanghai, CN
Howard Paul Weaver - Mason OH, US
James Allen Baird - Amelia OH, US
Xinjue Zou - Shanghai, CN
Kevin William Meyer - Cincinnati OH, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01B 11/24

US Classification:

356601, 356607

Abstract:

A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.

US Patent:

8112172, Feb 7, 2012

Filed:

Apr 29, 2009

Appl. No.:

12/431999

Inventors:

Tian Chen - Shanghai, CN
Kevin George Harding - Niskayuna NY, US
Steven Robert Hayashi - Niskayuna NY, US
Xiaoming Du - Shanghai, CN
Howard Paul Weaver - Mason OH, US
James Allen Baird - Amelia OH, US
Xinjue Zou - Shanghai, CN
Kevin William Meyer - Cincinnati OH, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G06F 19/00
G01B 5/20

US Classification:

700175, 700195, 702167

Abstract:

A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.

US Patent:

20110317909, Dec 29, 2011

Filed:

Jun 29, 2010

Appl. No.:

12/825734

Inventors:

Satheesh Jeyaraman - Bangalore, IN
Kevin George Harding - Niskayuna NY, US
Anandraj Sengupta - Bangalore, IN
Debasish Mishra - Bangalore, IN
Suneel Tumkur Shankarappa - Hyderabad, IN
Howard Paul Weaver - Mason OH, US
Kevin William Meyer - Cincinnati OH, US

Assignee:

GENERAL ELECTRIC COMPANY - SCHENECTADY NY

International Classification:

G06K 9/00

US Classification:

382152

Abstract:

A portable wear quantification system includes a hand-held image acquisition device and a fixture. The fixture includes a first end coupled to the image acquisition device. A light source emits a light beam along an emission axis. A beam splitter is disposed at an angle with respect to an axis of view of the image acquisition device for directing the beam from the light source toward a portion of an object. A second end of the fixture is located on an opposite side of the beam splitter from the first end. The second end includes a platform that is configured to position the fixture with respect to the object. A channel extends from the first end to the second end along the axis of view of the image acquisition device.

US Patent:

20180339398, Nov 29, 2018

Filed:

May 26, 2017

Appl. No.:

15/606348

Inventors:

- Schenectady NY, US
Kevin William Meyer - Cincinnati OH, US

International Classification:

B24B 53/095
B24B 39/02
B24B 49/08
B24B 55/04

Abstract:

A burnishing tool and a method of additively manufacturing components of the burnishing tool are provided. The burnishing tool includes a burnishing element for burnishing a workpiece. The burnishing element is positioned between an upper nozzle and a lower nozzle which are additively manufactured to define a plurality of internal fluid passageways for receiving, distributing, and discharging a burnishing fluid to facilitate cooling and/or lubrication of the burnishing element and/or the workpiece.

US Patent:

20140238119, Aug 28, 2014

Filed:

Aug 29, 2012

Appl. No.:

14/345966

Inventors:

Xiaoming Du - Shanghai, CN
Kevin George Harding - Niskayuna NY, US
Howard Paul Weaver - Mason OH, US
James Allen Baird - Amelia OH, US
Kevin William Meyer - Cincinnati OH, US
Jiajun Gu - Shanghai, CN

International Classification:

G01B 21/20

US Classification:

73104

Abstract:

A method for obtaining an edge prep profile of a cutting tool with a point sensor. The method includes: (a) scanning edge points of the cutting tool, including a target edge point on a target edge, with the point sensor, by rotating the cutting tool around its axis, to generate a first point cloud; (b) repositioning the point sensor and cutting tool relative to each other based on the location and orientation information of the target edge point, such that the sensor focus is at a region of interest containing the target edge point; and (c) scanning the region of interest using the point sensor to generate a second point cloud. The first point cloud includes location and orientation information of the target edge point. The second point cloud includes information for edge profile analysis.

Address:

10045 Arborwood Dr, Cincinnati, OH 45251

VIN:

1FMFK17507LA59808

Make:

FORD

Model:

EXPEDITION EL

Year:

2007