Kevin T Nguyen

US Patent:

7411532, Aug 12, 2008

Filed:

Aug 31, 2006

Appl. No.:

11/514554

Inventors:

Alfio Zanchi - Colorado Springs CO, US
Kevin Quynh Nguyen - Plano TX, US

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

H03M 1/10

US Classification:

341120, 341155

Abstract:

A method for determining a minimization factor for improving linearity of an analog-to-digital converter including a plurality of components includes the steps of: (a) Evaluating integral non-linearity response of the apparatus to identify significant departures of the response greater than a predetermined amplitude and to relate each respective significant departure with a respective identified component. (b) Determining magnitude of each significant departure. (c) Identifying a trimming factor related with each component. (d) Determining a residual gap magnitude for each significant departure. The residual gap magnitude comprises the magnitude of the respective significant departure less the trimming factor related with the identified component. (e) Determining the minimization factor as a sum of the residual gap magnitudes for a selected plurality of the identified components.

US Patent:

7439888, Oct 21, 2008

Filed:

Aug 31, 2006

Appl. No.:

11/514482

Inventors:

Alfio Zanchi - Colorado Springs CO, US
Kevin Quynh Nguyen - Plano TX, US

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

H03M 1/10

US Classification:

341120, 341155

Abstract:

A method digitally representing an integral non-linearity response for a device includes: (a) In no particular order: (1) Identifying locations of significant departures of the integral response, including: [a] Extracting first and second differential responses from the integral response in first and second device trim states. [b] Twice-filtering first and second differential responses to produce first and second filtered responses. [c] Determining difference between first and second filtered responses to produce a treated response. [d] Identifying a locus for each maximum of the treated response in a highest excursion range and in at least one lower excursion range. [e] Imposing zero amplitude on the treated response within a code range of each locus. Locations are centered within each code range. (2) Determining magnitude for each significant departure.