Khoa T Nguyen

US Patent:

20210143803, May 13, 2021

Filed:

Dec 11, 2020

Appl. No.:

17/119937

Inventors:

- Santa Clara CA, US
Mohsen Nasroullahi - Beaverton OR, US
Khoa Nguyen - Hillsboro OR, US

Assignee:

Intel Corporation - Santa Clara CA

International Classification:

H03K 3/03
H03K 5/131
H03K 5/133
H03L 7/081
H03L 7/087
H03L 7/095
H03L 7/099
H03L 7/107
H03L 7/197

Abstract:

An apparatus is provided to improve lock time of a phase locked loop, wherein the apparatus comprises: a ring oscillator including at least two delay stages, wherein each delay stage has a controllable delay; and a multiphase frequency monitor coupled to the ring oscillator to monitor frequency at an output of at least two delay stages of the ring oscillator.

US Patent:

20200127647, Apr 23, 2020

Filed:

Jun 29, 2018

Appl. No.:

16/605492

Inventors:

- Santa Clara CA, US
Mohsen Nasroullahi - Beaverton OR, US
Khoa Nguyen - Hillsboro OR, US

Assignee:

Intel Corporation - Santa Clara CA

International Classification:

H03K 3/03
H03K 5/131
H03K 5/133
H03L 7/095
H03L 7/099
H03L 7/197
H03L 7/087
H03L 7/081
H03L 7/107

Abstract:

An apparatus is provided to improve lock time of a phase locked loop, wherein the apparatus comprises: a ring oscillator including at least two delay stages, wherein each delay stage has a controllable delay; and a multiphase frequency monitor coupled to the ring oscillator to monitor frequency at an output of at least two delay stages of the ring oscillator.

US Patent:

20190393880, Dec 26, 2019

Filed:

Jul 1, 2019

Appl. No.:

16/458609

Inventors:

- Santa Clara CA, US
William Yee Li - Portland OR, US
Khoa Minh Nguyen - Hillsboro OR, US
Ashoke Ravi - Hillsboro OR, US
Maneesha Yellepeddi - San Jose CA, US
Binta M. Patel - Austin TX, US

International Classification:

H03L 7/085
H03L 1/00
H03L 7/099
H03L 7/08
H03L 7/091

Abstract:

A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

US Patent:

20170170833, Jun 15, 2017

Filed:

Feb 24, 2017

Appl. No.:

15/441603

Inventors:

- Santa Clara CA, US
William Yee Li - Portland OR, US
Khoa Minh Nguyen - Hillsboro OR, US
Ashoke Ravi - Hillsboro OR, US
Maneesha Yellepeddi - San Jose CA, US
Binta M. Patel - Austin TX, US

International Classification:

H03L 7/085
H03L 7/099

Abstract:

A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

US Patent:

20170070232, Mar 9, 2017

Filed:

Nov 17, 2016

Appl. No.:

15/354066

Inventors:

- Santa Clara CA, US
William Yee Li - Portland OR, US
Khoa Minh Nguyen - Hillsboro OR, US
Ashoke Ravi - Hillsboro OR, US
Maneesha Yellepeddi - San Jose CA, US
Binta M. Patel - Austin TX, US

International Classification:

H03L 7/099
H03L 7/091
H03L 1/00

Abstract:

A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

US Patent:

20160079992, Mar 17, 2016

Filed:

Sep 17, 2015

Appl. No.:

14/857145

Inventors:

- Santa Clara CA, US
William Yee Li - Portland OR, US
Khoa Minh Nguyen - Hillsboro OR, US
Ashoke Ravi - Hillsboro OR, US
Maneesha Yellepeddi - San Jose CA, US
Binta M. Patel - Austin TX, US

International Classification:

H03L 7/099
H03L 7/08
H03L 1/00

Abstract:

A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

US Patent:

20150188547, Jul 2, 2015

Filed:

Dec 30, 2013

Appl. No.:

14/143116

Inventors:

Cho-Ying Lu - Hillsboro OR, US
William Yee Li - Portland OR, US
Khoa Minh Nguyen - Hillsboro OR, US
Ashoke Ravi - Hillsboro OR, US
Maneesha Yellepeddi - San Jose CA, US
Binta M. Patel - Austin TX, US

International Classification:

H03L 1/00
H03L 7/08
H03L 7/099

Abstract:

A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Address:

304 SE 156 Ave, Vancouver, WA 98684

VIN:

WBAVC53527FZ70129

Make:

BMW

Model:

3 SERIES

Year:

2007