Kurt A Goetze

US Patent:

20140023180, Jan 23, 2014

Filed:

Jul 18, 2012

Appl. No.:

13/551788

Inventors:

Deming Shu - Darian IL, US
Yuri Shvydko - Lisle IL, US
Stanislav A. Stoupin - Willowbrook IL, US
Ruben Khachatryan - Plano IL, US
Kurt A. Goetze - Geneva IL, US
Timothy Roberts - Hobart IN, US

Assignee:

UCHICAGO ARGONNE, LLC - Chicago IL

International Classification:

G21K 1/06
B23P 11/00

US Classification:

378 85, 29428

Abstract:

A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.