A circuit circuit tester is provided for testing circuit runs of a circuit board for electrical continuity and electrical shorts. An electrical probe connected to one side of a capacitance meter is used to contact a particular circuit run, and an electrically conductive plate connected to the other side of the capacitance meter is maintained co-planar with and in close proximity to the circuit board to provide a suitable ground in the electrical test circuit, the capacitance of which circuit is a function of the electrical integrity of the circuit run. The measured capacitance is compared to a predetermined capacitance value for an identical circuit run of known acceptable quality to determine the electrical integrity of the tested circuit run.