Laszlo N Rudolics

age ~80

from Santa Barbara, CA

Also known as:
  • Laszlo Living Rudolics
  • Laslo Rudolics
  • Laszl Rudolics
  • Lazslo Rudolics
  • Rudolics Laszlo
Phone and address:
995 Rose Ln, Santa Barbara, CA 93110
8056871247

Laszlo Rudolics Phones & Addresses

  • 995 Rose Ln, Santa Barbara, CA 93110 • 8056871247 • 8058865104
  • 995 Rose Ln, Santa Barbara, CA 93110 • 8058865104

Work

  • Position:
    Craftsman/Blue Collar

Education

  • Degree:
    High school graduate or higher

Us Patents

  • Encased Time Domain Reflectometry Probe

    view source
  • US Patent:
    20030118832, Jun 26, 2003
  • Filed:
    Aug 30, 2001
  • Appl. No.:
    09/944538
  • Inventors:
    Whitney Skaling - Buellton CA, US
    Laszlo Rudolics - Santa Barbara CA, US
  • International Classification:
    B32B027/36
    B32B027/08
    B32B027/34
  • US Classification:
    428/412000, 428/413000, 428/474400
  • Abstract:
    A probe adapted for use with a time domain reflectrometry device in primarily measuring the moisture content in soils and other mediums. This probe can however be used in may differing measurement applications involving materials of specific dielectric constants as well as apparent dielectric constants that are derived from a matrix of several differing dielectrics. In the probe according to the present invention, the inner core of the probe is composed of an inner conductive element, a conductor that is used to transmit a broadband pulse. A dielectric liquid, solid or gel surrounds this inner conductive core, and assists in retaining broadband signal strength. The dielectric material is then encased in a metallic outer shell that serves as a protective housing for the probe. This outer shell is electronically transparent to the electromagnetic pulse transmitted by the active inner conductive core and surrounding dielectric. The outer shell is preferably made of stainless steel, but can be made of other materials as they serve to protect the inner dielectric material and conductive core. This combination of features allows a broadband pulse transmitted through the probe to penetrate into the material being measured, returning a much larger reflection feature upon reaching probe end points, while protecting the dielectric-coated transmission elements inside.

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