Li Liang

US Patent:

20060242167, Oct 26, 2006

Filed:

Apr 22, 2005

Appl. No.:

11/113112

Inventors:

Siddhartha Singh - Sammamish WA, US
Li Liang - Redmond WA, US
Zhongwei Wu - Sammamish WA, US
Tiberiu Doman - Redmond WA, US

Assignee:

Microsoft Corporation - Redmond WA

International Classification:

G06F 17/00

US Classification:

707100000

Abstract:

A test library for use with a database storage system such as WinFS provides users with a WinFS schema agnostic way to test the WinFS store application programming interfaces (APIs) and to use the WinFS store APIs to populate the WinFS store with randomly generated data. The WinFS test library provides users with an object layer that they can program against to carry out multiple tasks on the WinFS store. Tests can use the WinFS test library to generate schema-agnostic tests that do not break if a schema is changed or removed. For instance, a user can create a WinFS schema and install it in a WinFS store. The WinFS test library will automatically validate that the schema and all of its declared types are properly installed in the store. It will also generate instances of each type, set randomly generated values for every property including nested types, call the store API to create them in the store, and then select values from the store and validate that they were set property. The WinFS test library also automatically validates Update and Delete of the types. The WinFS test library also describes both the store types (metadata) and the store data in the same framework, making it straightforward to write tests on unknown schemas.