Li Su Lin

US Patent:

6520004, Feb 18, 2003

Filed:

Aug 3, 2000

Appl. No.:

09/601664

Inventors:

Li Lin - Wallingford PA

Assignee:

E. I. du Pont de Nemours and Company - Wilmington DE

International Classification:

G01N 346

US Classification:

73 81, 73 7

Abstract:

This invention concerns a test apparatus and procedure used for quantitative and qualitative characterization of scratch and mar behavior of films or coatings, more particularly automotive coatings. The apparatus includes a micro-indentor that penetrates and scratches the coating to be characterized together with interrelated components for measuring the force applied, the length and depth of the indentor penetration, the geometry of the disturbed coating surface as well as a system for measuring, analyzing and comparing test results.

US Patent:

7395722, Jul 8, 2008

Filed:

Nov 21, 2006

Appl. No.:

11/602522

Inventors:

Li Lin - Wallingford PA, US

Assignee:

E.I. du Pont de Nemours and Company - Wilmington DE

International Classification:

G01D 1/16

US Classification:

73789, 73790, 73791, 73795

Abstract:

This invention is directed to the measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width. This invention is further directed to the measurement of stress-strain relationships in thin films at controlled temperatures and at high strain rates above 100% per second.

US Patent:

8434377, May 7, 2013

Filed:

Jun 30, 2008

Appl. No.:

12/663918

Inventors:

Li Lin - Wallingford PA, US
James Lamonte Adams - Glenside PA, US

Assignee:

U.S. Coatings IP Co. LLC - Wilmington DE

International Classification:

G01N 33/00
G01N 3/56

US Classification:

73866, 73 7

Abstract:

The present invention is directed to a method for measuring sandability of a coating or an article. This invention is particularly directed to a method for measuring sandability of a coating or an article quantitatively by measuring weight loss of said coating or article after being sanded. This invention is also directed to a system for measuring sandability of a coating or an article using said method.

US Patent:

20130064614, Mar 14, 2013

Filed:

Jun 29, 2010

Appl. No.:

13/698999

Inventors:

Li Lin - Wallingford PA, US
Shi Hua Zhang - Wilmington DE, US

International Classification:

B23B 39/08

US Classification:

408 8

Abstract:

The present disclosure is directed to a device for producing standardized assay areas on conductive substrates coated with organic coating layers. The device can be used to produce standardized assay areas for corrosion evaluation tests at an accelerated rate.

US Patent:

20130064615, Mar 14, 2013

Filed:

Jun 29, 2010

Appl. No.:

13/699006

Inventors:

Li Lin - Wallingford PA, US
Shi Hua Zhang - Wilmington DE, US

Assignee:

E I DuPont De Nemours and Company - Wilmington DE

International Classification:

B23B 39/04

US Classification:

408 8

Abstract:

The present disclosure is directed to a portable device for producing standardized assay areas on conductive substrates coated with organic coating layers. The present disclosure is directed to a process for producing standardized assay areas using the portable device. The portable device and the process can be used to produce assay areas for corrosion evaluation tests at an accelerated rate. The portable device and the process are particularly useful for producing standardized assay areas on large or immobile structures or objects.

US Patent:

20130064617, Mar 14, 2013

Filed:

Jun 29, 2010

Appl. No.:

13/699002

Inventors:

Shi Hua Zhang - Wilmington DE, US
Li Lin - Wallingford PA, US

Assignee:

E I Du Pont de Nemours and Company - Wilmington DE

International Classification:

B23B 47/28

US Classification:

408 1 R

Abstract:

The present disclosure is directed to a process for producing standardized assay areas on conductive substrates coated with organic coating layers. The process can be used to produce standardized assay areas for corrosion evaluation tests at an accelerated rate.

US Patent:

55178600, May 21, 1996

Filed:

Feb 3, 1995

Appl. No.:

8/382815

Inventors:

Li Lin - Wallingford PA
Melvin H. Johnson - Chadds Ford PA

Assignee:

E. I. Du Pont de Nemours and Company - Wilmington DE

International Classification:

G01D 116

US Classification:

73789

Abstract:

Measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width.

US Patent:

20220305279, Sep 29, 2022

Filed:

Jul 9, 2020

Appl. No.:

17/620032

Inventors:

- Washington DC, US
DAYUN YAN - Ashburn VA, US
XIAOLIANG YAO - Fairfax VA, US
Li LIN - Arlington VA, US
Vikas SONI - Washington DC, US
Jonathan SHERMAN - Potomac MD, US

International Classification:

A61N 2/00
A61K 31/495
A61P 35/00

Abstract:

A method and system of sensitization of cancerous cells in a volume is disclosed. A plasma tube including a pair of electrodes coupled to a power supply is provided. The plasma tube generates a plasma jet between the electrodes. A controller is coupled to a power supply to control a discharge voltage to the electrodes to generate the plasma jet and direct an electro-magnetic field at the volume having cancerous cells and normal cells for a sufficient time to sensitize the cancer cells. A treatment device applies a treatment such as TMZ to the sensitized cancer cells after the cancer cells are sensitized by the electro-magnetic field.