Lucille M Kayes

US Patent:

63046806, Oct 16, 2001

Filed:

Oct 22, 1998

Appl. No.:

9/176864

Inventors:

Scott W. Blake - Westford MA
Frederick S. Fenning - late of Medford MA
Lucille M. Kayes - Bothell WA
Ilya Lapshin - Brookline MA

Assignee:

Assembly Guidance Systems, Inc. - Chelmsford MA

International Classification:

G06K 936

US Classification:

382285

Abstract:

A method and system for monitoring a process which determines a location of a product in three dimensional space with respect to a process monitoring system. This is accomplished by generating a rotation and translation transform which enables the process monitoring system to define the location of the product placed in a field of view of the process monitoring system, applying the transform to three dimensional CAD data defining the process being performed with respect to the product to provide transformed CAD data representative of three dimensional information in a two dimensional pattern of the process with respect to the process monitoring system. Utilizing the above, a determination is made whether the two dimensional pattern of the process is present within a range of acceptable images of the process performed with respect to the product. If the product is processed properly the two dimensional pattern of the process is present within the range of acceptable images.