Mark Alan Freeman

US Patent:

7167315, Jan 23, 2007

Filed:

Apr 20, 2004

Appl. No.:

10/828876

Inventors:

Mathew D. Watson - Bellevue WA, US
Mark Freeman - Snohomish WA, US

Assignee:

Microvision, Inc. - Redmond WA

International Classification:

G02B 27/10

US Classification:

359634, 359618

Abstract:

A beam combiner includes a first beam-input face, a beam-output face, and first and second reflectors. The first beam-input face receives first and second beams of electromagnetic energy respectively having a first and second wavelengths. The first reflector reflects the first received beam toward the beam-output face, and the second reflector passes the first beam from the first reflector and reflects the received second beam toward the beam-output face. In one alternative, the first beam-input face also receives a third beam of electromagnetic energy having a third wavelength, the beam combiner includes a third reflector that reflects the received third beam toward the beam-output face, and the first and second reflectors pass the third beam from the third reflector. In another alternative, the beam combiner includes a second beam-input face that receives a third beam directed toward the beam-output face, and the first and second reflectors pass the third beam.

US Patent:

7381095, Jun 3, 2008

Filed:

Jun 20, 2005

Appl. No.:

11/157237

Inventors:

Mark Freeman - Torrance CA, US
Edgar Carrasco - Lynwood CA, US

Assignee:

Belkin International, Inc. - Compton CA

International Classification:

H01R 25/00

US Classification:

439638, 439928, 361686

Abstract:

A multi-standard connection hub includes a housing () having a first surface (), a second surface () spaced apart from the first surface, and a sidewall () extending between the first surface and the second surface. The multi-standard connection hub further includes a first connection port () at the first surface and a second connection () port at the sidewall. The first connection port operates according to a first standard and the second connection port operates according to a second standard.

US Patent:

7491919, Feb 17, 2009

Filed:

Dec 21, 2005

Appl. No.:

11/316683

Inventors:

David Skurnik - Kirkland WA, US
Mark Freeman - Snohomish WA, US
Randy Sprague - Carnation WA, US
Margaret Brown - Seattle WA, US
Harpal Sira - Surrey, CA

Assignee:

Microvision, Inc. - Redmond WA

International Classification:

H01L 27/00
H01J 3/14

US Classification:

2502081, 250234

Abstract:

A circuit for detecting a phase error between a clock signal and a beam position includes a beam generator, a sensor, and a phase detector. The beam generator directs a beam toward a beam sweeper in response to the clock signal, and the sensor detects the beam as directed from the beam sweeper. The phase detector determines from the detected beam the error in the clock phase relative to the beam position. Such a circuit can automatically detect the phase error in the pixel clock and correct this error, thus eliminating the need for a manual phase-error corrector. The circuit may also be able to adjust the width and/or the height of a scan region, and thus may also be able to adjust the width and/or height of an image frame within the scan region.

US Patent:

7580007, Aug 25, 2009

Filed:

May 19, 2003

Appl. No.:

10/441916

Inventors:

Margaret Brown - Seattle WA, US
Mark Freeman - Snohomish WA, US
John R. Lewis - Bellevue WA, US
Jim Bovee - Seattle WA, US
Randy Sprague - Carnation WA, US

Assignee:

Microvision, Inc. - Redmond WA

International Classification:

G09G 1/08

US Classification:

345 15

Abstract:

A scan assembly of an image generator sweeps an image beam in a first dimension at a first rate and bi-directionally in a second dimension at a slower rate. Sweeping the beam bi-directionally in the vertical dimension (generally the dimension of the lower sweep rate) can reduce the scanning power by eliminating the flyback period, and, where the scan assembly includes a mechanical reflector, can reduce the error in the beam position without a feedback loop by reducing the number of harmonics in the vertical sweep function. Furthermore, because the image beam is “on” longer due to the elimination of the flyback period, the scanned image is often brighter for a given beam intensity. The scan assembly may also sweep the image beam non-linearly in the vertical dimension, and this sweep may be bi-directional or uni-directional. Sweeping the beam non-linearly can also reduce the error in the beam position by reducing the number of harmonics in the vertical sweep function.

US Patent:

7901084, Mar 8, 2011

Filed:

Nov 2, 2006

Appl. No.:

11/592757

Inventors:

Stephen R. Willey - Bellevue WA, US
Randall B. Sprague - Carnation WA, US
Thomas W. Montague - Mercer Island WA, US
Christopher A. Wiklof - Everett WA, US
Maarten Niesten - Kirkland WA, US
Mark Freeman - Snohomish WA, US
Bruce Rothaar - Woodinville WA, US
V. G. Veeraraghavan - Redmond WA, US
John R. Lewis - Bellevue WA, US

Assignee:

Microvision, Inc. - Redmond WA

International Classification:

G03B 21/14
G03B 21/26
G03B 21/00

US Classification:

353 49, 353 82, 353122

Abstract:

A portable video projector includes facility to direct a projected image field along an axis in an alignment corresponding to the state of an optical element.

US Patent:

7956858, Jun 7, 2011

Filed:

Oct 1, 2010

Appl. No.:

12/896185

Inventors:

Randall B. Sprague - Hansville WA, US
Joshua O. Miller - Woodinville WA, US
Margaret K. Brown - Seattle WA, US
Mark O. Freeman - Snohomish WA, US
Maarten Niesten - Kirkland WA, US
Bin Xue - Mukilteo WA, US
Christopher A. Wiklof - Everett WA, US

Assignee:

Microvision, Inc. - Redmond WA

International Classification:

G06F 3/038

US Classification:

345204, 348757, 359201

Abstract:

An integrated photonics module includes at least one light source and a MEMS scanner coupled to and held in alignment by an optical frame configured for mounting to a host system. According to some embodiments, the integrated photonics module may include a plurality of light sources and a beam combiner coupled to the optical frame. According to some embodiments, the integrated photonics module includes a selective fold mirror configured to direct at least a portion of emitted light toward the MEMS scanner in a normal direction and pass scanned light through to a field of view. The selective fold mirror may use beam polarization to select beam passing and reflection. The integrated photonics module may include a beam rotator such as a quarter-wave plate to convert the polarization of the emitted light to a different polarization adapted for passage through the fold mirror. The integrated photonics module may include one or more light detectors.

US Patent:

7978189, Jul 12, 2011

Filed:

Oct 1, 2010

Appl. No.:

12/896230

Inventors:

Randall B. Sprague - Hansville WA, US
Joshua O. Miller - Woodinville WA, US
Margaret K. Brown - Seattle WA, US
Mark O. Freeman - Snohomish WA, US
Maarten Niesten - Kirkland WA, US
Bin Xue - Mukilteo WA, US
Christopher A. Wiklof - Everett WA, US

Assignee:

Microvision, Inc. - Redmond WA

International Classification:

G06F 3/038

US Classification:

345204, 348 61, 359208

Abstract:

An integrated photonics module includes at least one light source and a MEMS scanner coupled to and held in alignment by an optical frame configured for mounting to a host system. According to some embodiments, the integrated photonics module may include a plurality of light sources and a beam combiner coupled to the optical frame. According to some embodiments, the integrated photonics module includes a selective fold mirror configured to direct at least a portion of emitted light toward the MEMS scanner in a normal direction and pass scanned light through to a field of view. The selective fold mirror may use beam polarization to select beam passing and reflection. The integrated photonics module may include a beam rotator such as a quarter-wave plate to convert the polarization of the emitted light to a different polarization adapted for passage through the fold mirror. The integrated photonics module may include one or more light detectors.

US Patent:

7986315, Jul 26, 2011

Filed:

Oct 1, 2010

Appl. No.:

12/896270

Inventors:

Randall B. Sprague - Hansville WA, US
Joshua O. Miller - Woodinville WA, US
Margaret K. Brown - Seattle WA, US
Mark O. Freeman - Snohomish WA, US
Maarten Niesten - Kirkland WA, US
Bin Xue - Mukilteo WA, US
Christopher A. Wiklof - Everett WA, US

Assignee:

Microvision, Inc. - Redmond WA

International Classification:

G06F 3/038

US Classification:

345204, 345 84, 359208

Abstract:

An integrated photonics module includes at least one light source and a MEMS scanner coupled to and held in alignment by an optical frame configured for mounting to a host system. According to some embodiments, the integrated photonics module may include a plurality of light sources and a beam combiner coupled to the optical frame. According to some embodiments, the integrated photonics module includes a selective fold mirror configured to direct at least a portion of emitted light toward the MEMS scanner in a normal direction and pass scanned light through to a field of view. The selective fold mirror may use beam polarization to select beam passing and reflection. The integrated photonics module may include a beam rotator such as a quarter-wave plate to convert the polarization of the emitted light to a different polarization adapted for passage through the fold mirror. The integrated photonics module may include one or more light detectors.