Mark R Mccleary

US Patent:

20220177154, Jun 9, 2022

Filed:

Nov 2, 2021

Appl. No.:

17/453304

Inventors:

- Chicago IL, US
Aruna Jammalamadaka - Agoura Hills CA, US
Greg Blaire - Scottsdale AZ, US
Joseph Wilson - Lynnwood WA, US
Heath W. Haga - Mount Pleasant SC, US
Mark Daniel McCleary - Seattle WA, US
Brandon M. Courter - Mount Pleasant SC, US
Kangyu Ni - Calabasas CA, US

International Classification:

B64D 45/00
B64D 43/00
G06N 20/00
G06K 9/62

Abstract:

A testing system, a testing method, and a training method for the testing system are disclosed. According to an example, a computing system of the testing system processes a set of data streams of test data for a test subject in combination with a previously trained nominal model by, for each parameter of the test subject: selecting a parameter-specific control band defined by the nominal model for the parameter; comparing a time-based series of measurements of the test data for the parameter to the parameter-specific control band for the parameter, and selectively generating a test result for the parameter responsive to whether a condition is satisfied with respect to any of the time-based series of measurements exceeding the parameter-specific control band for the parameter.