Mark Gregory Roth

US Patent:

20140319355, Oct 30, 2014

Filed:

Mar 17, 2014

Appl. No.:

14/215781

Inventors:

- Washington DC, US
H. Kevin Rivers - Yorktown VA, US
Joseph G. Sikora - Norfolk VA, US
Mark C. Roth - Suffolk VA, US
William M. Johnston - Newport News VA, US

International Classification:

G01N 3/06
G01J 5/02

US Classification:

2503416, 250352

Abstract:

An ultra-high temperature optical method incorporates speckle optics for sensing displacement and strain measurements well above conventional measurement techniques. High temperature pattern materials are used which can endure experimental high temperature environments while simultaneously having a minimum optical aberration. A purge medium is used to reduce or eliminate optical distortions and to reduce, and/or eliminate oxidation of the target specimen.