Mark E Ward

US Patent:

56894473, Nov 18, 1997

Filed:

Dec 1, 1995

Appl. No.:

8/565787

Inventors:

Mark Ward - Ypsilanti MI

Assignee:

Control Gaging, Inc. - Ann Arbor MI

International Classification:

G01K 500

US Classification:

36457103

Abstract:

A temperature-compensated, self-calibrating, contact-type gaging system and method for calibrating the same. The system is configured to run in a calibration mode and a measurement mode. During the calibration mode, a unique temperature profile is generated for each particular system. The temperature offset includes offset values calculated to compensate for gaging system hardware errors as well as other measurement error caused by temperature variations encountered during gaging applications. In the measurement mode, part size measurements are adjusted by the offsets contained in the temperature profile generated for the gaging system.

US Patent:

20210264371, Aug 26, 2021

Filed:

Feb 19, 2021

Appl. No.:

17/180320

Inventors:

- New York NY, US
Lewis Baker - New York NY, US
Mark Ward - Denver CO, US

International Classification:

G06Q 10/10
G16H 50/70
A63F 13/79

Abstract:

The present disclosure describes talent-identification systems and methods that can be used by companies to assist in the recruitment process for new employees. Additionally, the systems and methods can be used by job seekers to determine ideal career fields and industries. The systems and methods may employ an array of neuroscience-based tests to assess a user's career propensities, after which the systems and methods can provide career recommendations to the user or report on employment suitability of the user to a company, and data structures, such as a role directed graph with nodes and links, each node associated with a node role, each link from a parent node to a child node representing a criterion for selecting the child node of that link based on a measurement derived from received input data.