Mark Adam Whitaker

US Patent:

7526693, Apr 28, 2009

Filed:

Mar 9, 2006

Appl. No.:

11/371661

Inventors:

David J. Willis - Murray UT, US
Matthew Austin Tyler - Kaysville UT, US
Justin Mark Gedge - Eagle Mountain UT, US
Mark R. Whitaker - Draper UT, US

Assignee:

Semiconductor Components Industries, LLC - Phoenix AZ

International Classification:

G01R 31/28

US Classification:

714724, 714 36, 714 48, 714740, 714742, 702 98, 702 85, 3652257, 36518503, 712 39, 712 40, 712 43, 31856817, 318590, 31840009, 31840011, 710 14

Abstract:

A circuit that includes a controller and at least one control I/O pin. When the controller is placed into an initial state, the controller initializes the circuit into an initial operation mode. Depending on whether or not signal(s) satisfying predetermined criteria are applied to at least one of the control I/O pins, the controller will cause the circuit to enter one of two or more post-initial operation modes. Accordingly, by initializing the controller, and by controlling a signal on the control I/O pin(s), the operating mode of the circuit may be controlled. In one embodiment, a given control pin might be configurable to be both analog and digital, depending on the circuit's operation mode.

US Patent:

59364114, Aug 10, 1999

Filed:

Nov 28, 1997

Appl. No.:

8/980325

Inventors:

Stephen C. Jacobsen - Salt Lake City UT
Michael G. Mladejovsky - Salt Lake City UT
Mark R. Whitaker - Salt Lake City UT
Brian J. Maclean - Salt Lake City UT

Assignee:

Sarcos L.C. - Salt Lake City UT

International Classification:

G01R 2726

US Classification:

324662

Abstract:

A method and apparatus for measuring displacement of one location of a structure, relative to another, spaced apart location. The apparatus includes a first array of conductive elements disposed on the structure and attached at said one location; a second array of conductive elements disposed on the structure adjacent the first array and attached at said other, spaced-apart location such that displacement of said one location with respect to said other, spaced-apart location can be measured by measuring the first array position with respect to the second array position; a source for supplying an electric current to the first and the second array of conductive elements to develop a unique charge between each conductive element of the first array and each respective conductive element of the second array, wherein the unique charge that is stored between each pair of conductive elements changes when the relative position of the first array changes with respect to the second array and the change in charges corresponds to the displacement of the one location with respect to the other, spaced apart location.