Martin J Carr

US Patent:

49167219, Apr 10, 1990

Filed:

Aug 5, 1987

Appl. No.:

7/081964

Inventors:

Martin J. Carr - Tijeras NM
Alton D. Romig - Albuquerque NM

Assignee:

The United States of America as represented by the United States
Department of Energy - Washington DC

International Classification:

G21K 106

US Classification:

378 84

Abstract:

A non-planar, focusing mirror, to be utilized in both electron column instruments and micro-x-ray fluorescence instruments for performing chemical microanalysis on a sample, comprises a concave, generally spherical base substrate and a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on the base substrate. The thickness of each layer is an integral multiple of the wavelength being reflected and may vary non-uniformly according to a predetermined design. The chemical analytical instruments in which the mirror is used also include a predetermined energy source for directing energy onto the sample and a detector for receiving and detecting the x-rays emitted from the sample; the non-planar mirror is located between the sample and detector and collects the x-rays emitted from the sample at a large solid angle and focuses the collected x-rays to the sample. For electron column instruments, the wavelengths of interest lie above 1. 5 nm, while for x-ray fluorescence instruments, the range of interest is below 0. 2 nm.