Max R Hall

US Patent:

20150157200, Jun 11, 2015

Filed:

Nov 3, 2014

Appl. No.:

14/531926

Inventors:

- Aliso Viejo CA, US
Thomas D. Padrick - Seattle WA, US
Max Hall - Corona CA, US

International Classification:

A61B 3/00
A61B 3/10

Abstract:

A system and method for determining an objective quality metric for image data collected by a wavefront aberrometer. The method may include quantifying a plurality of characteristics of the image data and calculating the objective quality metric based on the quantified characteristics of the image data. The objective quality metric can be a weighted sum of the quantified characteristics of the image data. The weightings for the weighted sum can be determined based on subjective quality metrics assigned to a set of training image data by a human expert.