Michael P Bordelon

US Patent:

7542139, Jun 2, 2009

Filed:

Jul 17, 2006

Appl. No.:

11/487724

Inventors:

Michael Bordelon - Saint Martinville LA, US

Assignee:

Core Laboratories LP - Houston TX

International Classification:

G01N 15/02

US Classification:

356335

Abstract:

A system for determining a parameter of interest of at least one particle in a sample of a fluid obtained from a formation, comprises a view cell containing at least a portion of the sample and at least one window for viewing the sample. A light source illuminates the sample. An imaging system captures at least one image of the illuminated sample. A program executing a set of instructions on a computer analyzes the at least one image and generates an output related to at least one parameter of interest of the at least one particle in said sample.

US Patent:

20050134845, Jun 23, 2005

Filed:

Dec 19, 2003

Appl. No.:

10/742359

Inventors:

Michael Bordelon - Saint Martinville LA, US

Assignee:

Core Laboratories LP - Houston TX

International Classification:

G01N015/02

US Classification:

356336000

Abstract:

A system for determining a parameter of interest of at least one particle in a sample of a fluid obtained from a formation, comprises a view cell containing at least a portion of the sample and at least one window for viewing the sample. A light source illuminates the sample. An imaging system captures at least one image of the illuminated sample. A program executing a set of instructions on a computer analyzes the at least one image and generates an output related to at least one parameter of interest of the at least one particle in said sample.