Stephen P. Robb - Tempe AZ John P. Phipps - Phoenix AZ Michael D. Gadberry - Tempe AZ
Assignee:
Motorola, Inc. - Schaumburg IL
International Classification:
H02H 902 H03K 1708 G05F 163
US Classification:
361 93
Abstract:
A power transistor having a control electrode which is coupled to a polysilicon JFET transistor is provided. In particular, a power MOSFET device having a polysilicon gate is formed and a JFET transistor is formed in the same polysilicon layer which forms the gate of the power MOSFET. A drain of the JFET forms an input terminal for the power MOSFET and a source of the JFET is coupled to the gate of the power MOSFET. A gate of the JFET is coupled to a gate-drain diode clamp so that when the gate-drain diode clamp is activated a portion of the current which is used to turn on the power MOSFET is channeled to the gate of the JFET and increases the drain-to-source series resistance of the JFET. The resistance of the JFET is low during normal operation and increases only when the gate-drain clamp is activated thus provides a high resistance during avalanche stress protection and a low resistance during normal operation.
Avalanche Stress Protected Semiconductor Device Having Variable Input Impedance
Stephen P. Robb - Tempe AZ John P. Phipps - Phoenix AZ Michael D. Gadberry - Tempe AZ
Assignee:
Motorola, Inc. - Schaumburg IL
International Classification:
H01L 2980 H01L 2906 H01L 2910 H01L 2702
US Classification:
357 2313
Abstract:
A power transistor having a control electrode which is coupled to a polysilicon JFET transistor is provided. In particular, a power MOSFET device having a polysilicon gate is formed and a JFET transistor is formed in the same polysilicon layer which forms the gate of the power MOSFET. A drain of the JFET forms an input terminal for the power MOSFET and a source of the JFET is coupled to the gate of the power MOSFET. A gate of the JFET is copupled to a gate-drain diode clamp so that when the gate-drain diode clamp is activated a portion of the current which is used to turn on the power MOSFET is channeled to the gate of the JFET and increases the drain-to-source series resistance of the JFET. The resistance of the JFET is low during normal operation and increases only when the gate-drain clamp is activated thus provides a high resistance during avalanche stress protection and a low resistance during normal operation.
David Cave - Tokyo, JP Michael D. Gadberry - Tempe AZ
International Classification:
H03K 301 H03K 522
US Classification:
3072966
Abstract:
A start circuit for a bandgap reference cell using CMOS transistors including a transistor connected between the bandgap reference cell and a differential amplifier in the feedback path to create an offset voltage in the bandgap reference cell when power is first applied, which offset insures the correct operation of the bandgap reference cell, and to turn off after correct operation has been achieved.
Mike Gadberry (1974-1978), Keith Hudson (1989-1993), Angela Davis (1984-1988), Nick Elliott (1981-1985), Dale Cooley (1961-1965), Mickey Martin (1952-1956)