Semiconductors • Jmp • Design of Experiments • Electric Vehicles • Renewable Energy • Reliability • Reliability Engineering • Weibull Analysis • Spc • Yield Management • Process Improvement • Process Integration • Fuel Cells • Alternative Energy • Alternative Fuels • Renewable Fuels • Nand Flash • Dram • Physics • Solar Energy • Labview • Manufacturing • Engineering • Electronics • Semiconductor Industry • Statistical Process Control
- Boise ID, US Xiangang Luo - Fremont CA, US Preston Allen Thomson - Boise ID, US Michael G. McNeeley - Boise ID, US
International Classification:
G06F 11/10 G11C 29/52 G06F 3/06
Abstract:
A variety of applications can include apparatus and/or methods that provide parity protection to data spread over multiple memory devices of a memory system. Parity is stored in a buffer, where the parity is generated from portions of data written to a page having a different portion of the page in a portion of each plane of one or more planes of the multiple memory devices. Parity is stored in the buffer for each page. In response to a determination that a transfer criterion is satisfied, the parity data in the buffer is transferred from the buffer to a temporary block. After programming data into the block to close the block, a verification of the block with respect to data errors is conducted. In response to passing the verification, the temporary block can be released for use in a next data write operation. Additional apparatus, systems, and methods are disclosed.
- Boise ID, US Xiangang Luo - Fremont CA, US Preston Thomson - Boise ID, US Michael G. McNeeley - Boise ID, US
International Classification:
G06F 11/10 G11C 29/52 G06F 3/06
Abstract:
A variety of applications can include apparatus and/or methods that provide parity protection to data spread over multiple memory devices of a memory system. Parity is stored in a buffer, where the parity is generated from portions of data written to a page having a different portion of the page in a portion of each plane of one or more planes of the multiple memory devices. Parity is stored in the buffer for each page. In response to a determination that a transfer criterion is satisfied, the parity data in the buffer is transferred from the buffer to a temporary block. After programming data into the block to close the block, a verification of the block with respect to data errors is conducted. In response to passing the verification, the temporary block can be released for use in a next data write operation. Additional apparatus, systems, and methods are disclosed.
Adaptive Scan Frequency For Detecting Errors In A Memory System
- Boise ID, US William C. Filipiak - Boise ID, US Michael G. McNeeley - Boise ID, US Kishore K. Muchherla - Fremont CA, US Sampath K. Ratnam - Boise ID, US Akira Goda - Boise ID, US Todd A. Marquart - Boise ID, US
International Classification:
G06F 11/07 G11C 29/10
Abstract:
Performing a first set of scans on a memory device in a memory system with a first time interval between each scan of the first set of scans to detect errors on the memory device, determining, from performing the first set of scans, that a rate of errors being detected on the memory device is changing, and performing a second set of scans with a second time interval between each scan of the second set of scans to detect errors on the memory device, in response to determining that the rate of errors being detected on the memory device is changing, wherein the second time interval is different than the first time interval.
Micron Technology
Ssd Reliablity Engineer
Transform Mfg Llc Jul 2011 - Jun 2012
Research and Development Reliability Engineer
Colorado Fuel Cell Center Oct 2010 - Feb 2011
Visiting Research Faculty
Im Flash Technologies Dec 2007 - Dec 2009
Process Integration Engineer
Micron Technology Jul 2004 - Dec 2007
Process Integration Engineer
Education:
Háskólinn Á Akureyri 2010 - 2011
Master of Science, Masters, Energy
Western Washington University 1998 - 2003
Bachelors, Bachelor of Science, Physics
Skills:
Semiconductors Jmp Design of Experiments Electric Vehicles Renewable Energy Reliability Reliability Engineering Weibull Analysis Spc Yield Management Process Improvement Process Integration Fuel Cells Alternative Energy Alternative Fuels Renewable Fuels Nand Flash Dram Physics Solar Energy Labview Manufacturing Engineering Electronics Semiconductor Industry Statistical Process Control