Michael D Newell

US Patent:

6795189, Sep 21, 2004

Filed:

Jun 1, 2001

Appl. No.:

09/872953

Inventors:

David Dickson Booker - Chicago IL
Robert E. Fischer - Westlake Village CA
Michael P. Newell - Thousand Oaks CA
David W. Kappel - San Diego CA
Scott Moritz - Villa Park IL
Jerome E. Oleksy - Park Ridge IL

Assignee:

Packard Instrument Company - Downers Grove IL

International Classification:

G01N 2125

US Classification:

356417, 356317, 356318, 2504581, 2504591

Abstract:

A universal microplate analyzer capable of carrying out measurements on samples contained in the wells of microplates by fluorescence, absorbance, luminescence employs at least two light sources and optical fiber channels for directing excitation light to the sample wells. Flexibility of operation is provided by arrays of mirrors, apertures, and polarizers which can be positioned as required for the analysis to be carried out.

US Patent:

20050012929, Jan 20, 2005

Filed:

Aug 13, 2004

Appl. No.:

10/918577

Inventors:

David Booker - Chicago IL, US
Robert Fischer - Westlake Village CA, US
Michael Newell - Thousand Oaks CA, US
David Kappel - San Diego CA, US
Scott Moritz - Villa Park IL, US
Jerome Oleksy - Park Ridge IL, US

International Classification:

G01N021/00

US Classification:

356417000, 356073000, 250458100

Abstract:

A universal microplate analyzer capable of carrying out measurements on samples contained in the wells of microplates by fluorescence, absorbance, luminescence employs at least two light sources and optical fiber channels for directing excitation light to the sample wells. Flexibility of operation is provided by arrays of mirrors, apertures, and polarizers which can be positioned as required for the analysis to be carried out.

US Patent:

20220283804, Sep 8, 2022

Filed:

May 23, 2022

Appl. No.:

17/751233

Inventors:

- McLean VA, US
Jonathan BARBALAS - Chicago IL, US
Michael NEWELL - McLean VA, US
Ian KIRCHNER - Chicago IL, US
Graham EGER - Chicago IL, US
Sudipta Kumar GHOSH - Elk Grove Village IL, US
Shriyans LENKALA - Capentersville IL, US

Assignee:

Capital One Services, LLC - McLean VA

International Classification:

G06F 8/77
G06F 11/34
G06F 8/65
G06F 8/71

Abstract:

Methods and systems for a platform development version control system for monitoring contributors to software platform development. The methods and systems generate data analytics on contributors to software platform development using group affiliations as listed in a group directory (e.g., a corporate directory for an entity providing the software platform) as a common organizing factor. For example, by organizing the methods and systems according to the group affiliations, the methods and systems may generate data analytics on contributions of contributors within those groups, irrespective of whether or not the group members are working on the same project. The methods and systems may then provide recommendations and graphical representations based on the data analytics.