Michael T Phenis

age ~63

from Markleville, IN

Also known as:
  • Michael D Phenis
Phone and address:
16 Lick Creek Dr, Markleville, IN 46056

Michael Phenis Phones & Addresses

  • 16 Lick Creek Dr, Markleville, IN 46056
  • Elwood, IN

Work

  • Company:
    Lord chemical products inc. /formerly thermoset plastics inc.
    1991 to 2002
  • Address:
    Lord Co,rporation purchased Thermoset Plastics in 1995
  • Position:
    R&d formulator/technical service representative

Education

  • School / High School:
    Indiana University Kokomo
    1980 to 1981
  • Specialities:
    Electrical Engineering Technology

Skills

R&D • Product Development • Cross Functional Team Leadership • Manufacturing • Project Management • Six Sigma • Microsoft Office • Materials • Quality System • Manufacturing Operations Management • Continuous Improvement • Electronics • Process Engineering • Design of Experiments • Fmea • Materials Science • Research and Development • Certified In Iso9000 and Qs9000 Quality ... • Six Sigma Green Belt • Microsoft Office Package • Strong Mechanical and Electrical Skills • Electrical Engineering Background • Detail Oriented and Proactive With Conti... • Quality Control • Failure Mode and Effects Analysis • Quality Assurance • Statistical Process Control

Ranks

  • Certificate:
    Qs9000 Internal Auditor

Industries

Semiconductors

Resumes

Michael Phenis Photo 1

Quality Specialist, Sp And C Qa

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Location:
Markleville, IN
Industry:
Semiconductors
Work:
Lord Chemical Products Inc. /formerly Thermoset Plastics Inc. - Lord Co,rporation purchased Thermoset Plastics in 1995 1991 - 2002
R&D Formulator/Technical Service Representative

Thermoset Plastics/Lord Corp. 1990 - 2001
Product Development Formulator

Thermoset Plastics Inc. 1985 - 1990
Quality Assurance Technician
Education:
Indiana University Kokomo 1980 - 1981
Villanova University 2009
Skills:
R&D
Product Development
Cross Functional Team Leadership
Manufacturing
Project Management
Six Sigma
Microsoft Office
Materials
Quality System
Manufacturing Operations Management
Continuous Improvement
Electronics
Process Engineering
Design of Experiments
Fmea
Materials Science
Research and Development
Certified In Iso9000 and Qs9000 Quality Systems
Six Sigma Green Belt
Microsoft Office Package
Strong Mechanical and Electrical Skills
Electrical Engineering Background
Detail Oriented and Proactive With Continuous Improvement Mindset
Quality Control
Failure Mode and Effects Analysis
Quality Assurance
Statistical Process Control
Certifications:
Qs9000 Internal Auditor
License 98-184
Aiag, License 98-184

Us Patents

  • Dynamic Multi-Purpose Composition For The Removal Of Photoresists And Method For Its Use

    view source
  • US Patent:
    7632796, Dec 15, 2009
  • Filed:
    Oct 28, 2005
  • Appl. No.:
    11/260912
  • Inventors:
    Michael T. Phenis - Markleville IN, US
    Lauri Kirby Kirkpatrick - Pittsboro IN, US
    Raymond Chan - Carmel IN, US
    Diane Marie Scheele - Greenwood IN, US
    Kimberly Dona Pollard - Anderson IN, US
    Gene Goebel - Danville CA, US
  • Assignee:
    Dynaloy, LLC - Indianapolis IN
  • International Classification:
    C11D 7/50
  • US Classification:
    510175, 510407
  • Abstract:
    Improved stripper solutions for removing photoresists from substrates are provided that typically have freezing points below about +15 C. and high loading capacities. The stripper solutions comprise dimethyl sulfoxide, a quaternary ammonium hydroxide, and an alkanolamine having at least two carbon atoms, at least one amino substituent and at least one hydroxyl substituent, the amino and hydroxyl substituents attached to two different carbon atoms. Some formulation can additionally contain a secondary solvent. Methods for use of the stripping solutions are additionally provided.
  • Reduced Metal Etch Rates Using Stripper Solutions Containing A Copper Salt

    view source
  • US Patent:
    7655608, Feb 2, 2010
  • Filed:
    Oct 30, 2007
  • Appl. No.:
    11/928754
  • Inventors:
    Kimberly Dona Pollard - Anderson IN, US
    Michael T. Phenis - Markleville IN, US
  • Assignee:
    Dynaloy, LLC - Indianapolis IN
  • International Classification:
    C11D 3/30
    C11D 3/04
    C11D 1/62
  • US Classification:
    510176, 510175, 510178, 510254, 510259, 510261, 510264, 134 12, 134 13
  • Abstract:
    Resist stripping agents, useful for fabricating circuits and/or forming electrodes on semiconductor devices for semiconductor integrated circuits with reduced metal etch rates, particularly copper etch rates, are provided with methods for their use. The preferred stripping agents contain low concentrations of a copper or cobalt salt with or without an added amine to improve solubility of the copper or cobalt salt. Further provided are integrated circuit devices and electronic interconnect structures prepared according to these methods.
  • Compositions For Reducing Metal Etch Rates Using Stripper Solutions Containing Copper Salts

    view source
  • US Patent:
    7851427, Dec 14, 2010
  • Filed:
    Feb 1, 2010
  • Appl. No.:
    12/697470
  • Inventors:
    Kimberly Dona Pollard - Anderson IN, US
    Michael T. Phenis - Markleville IN, US
  • Assignee:
    Dynaloy, LLC - Indianapolis IN
  • International Classification:
    C11D 3/30
    C11D 3/04
    C11D 1/62
  • US Classification:
    510176, 510175, 510178, 510254, 510259, 510261, 510264, 134 12, 134 13
  • Abstract:
    Resist stripping agents, useful for fabricating circuits and/or forming electrodes on semiconductor devices for semiconductor integrated circuits with reduced metal etch rates, particularly copper etch rates, are provided with methods for their use. The preferred stripping agents contain low concentrations of a copper salt with or without an added amine to improve solubility of the salt. Further provided are integrated circuit devices and electronic interconnect structures prepared according to these methods.
  • Dynamic Multi-Purpose Composition For The Removal Of Photoresists And Methods For Its Use

    view source
  • US Patent:
    8263539, Sep 11, 2012
  • Filed:
    Oct 23, 2006
  • Appl. No.:
    11/551826
  • Inventors:
    Michael T. Phenis - Markleville IN, US
    Diane Marie Scheele - Greenwood IN, US
    Kimberly Dona Pollard - Anderson IN, US
  • Assignee:
    Dynaloy, LLC - Kingsport TN
  • International Classification:
    C11D 7/32
  • US Classification:
    510176, 216 83
  • Abstract:
    Improved dry stripper solutions for removing one, two or more photoresist layers from substrates are provided. The stripper solutions comprise dimethyl sulfoxide, a quaternary ammonium hydroxide, and an alkanolamine, an optional secondary solvent and less than about 3 wt. % water and/or a dryness coefficient of at least about 1. Methods for the preparation and use of the improved dry stripping solutions are additionally provided.
  • Stripper Solutions Effective For Back-End-Of-Line Operations

    view source
  • US Patent:
    8440389, May 14, 2013
  • Filed:
    Jun 24, 2009
  • Appl. No.:
    12/490654
  • Inventors:
    Kimberly Dona Pollard - Anderson IN, US
    John M. Atkinson - Zionsville IN, US
    Raymond Chan - Westborough MA, US
    Michael T. Phenis - Markleville IN, US
    Allison C. Rector - Indianapolis IN, US
    Donald Pfettscher - Brownsburg IN, US
  • Assignee:
    Dynaloy, LLC - Kingsport TN
  • International Classification:
    G03F 7/30
    G03F 7/32
    C11D 7/32
  • US Classification:
    430329, 430331, 510175, 510176
  • Abstract:
    Back end of line (BEOL) stripping solutions which can be used in a stripping process that replaces etching resist ashing process are provided. The stripping solutions are useful for fabricating circuits and/or forming electrodes on semiconductor devices for semiconductor integrated circuits with good efficiency and with low and acceptable metal etch rates. Methods for their use are similarly provided. The preferred stripping agents contain a polar aprotic solvent, water, an amine and a quaternary hydroxide that is not tetramethylammonium hydroxide. Further provided are integrated circuit devices and electronic interconnect structures prepared according to these methods.
  • Low Viscosity, Flexible, Hydrolytically Stable Potting Compounds

    view source
  • US Patent:
    20040077773, Apr 22, 2004
  • Filed:
    Jul 11, 2003
  • Appl. No.:
    10/617987
  • Inventors:
    Manuel Tavares - Chester Township NJ, US
    Michael Phenis - Markleville IN, US
    Paul Hough - Indianapolis IN, US
  • International Classification:
    C08K003/00
  • US Classification:
    524/507000
  • Abstract:
    Novel liquid curable gelling material are disclosed and based on the reaction between a polyol-capped isocyanate and an adduct of an anhydride and a polyol. The liquid gelling material forms a gel characterized by both urethane and ester linkages. In a specific embodiment, the two part curable liquid potting composition comprises in part A, a hydroxyl capped polyisocyanate, and less than 1000 ppm of free isocyanate, and in part B, an anhydride adduct of polybutadiene comprising a polybutadiene segment. The preferred polybutadiene segment has a molecular weight of from 500 and 20,000. In a second embodiment, the 2-part curable liquid potting composition comprises in part A: a polybutaidene polyol capped polyisocyanate containing less than 1000 ppm of free isocyanate, and in part B an anhydride adduct of a polyol having a molecular weight of from 500 and 20,000.
  • Dynamic Multi-Purpose Composition For The Removal Of Photoresists And Method For Its Use

    view source
  • US Patent:
    20070243773, Oct 18, 2007
  • Filed:
    Apr 5, 2007
  • Appl. No.:
    11/697047
  • Inventors:
    Michael Phenis - Markleville IN, US
    Raymond Chan - Carmel IN, US
    Kimberly Pollard - Anderson IN, US
  • International Classification:
    H01B 13/00
    H01R 13/46
  • US Classification:
    439892000, 216016000
  • Abstract:
    Improved dry stripper solutions for removing one, two or more photoresist layers from substrates are provided. The stripper solutions comprise dimethyl sulfoxide, a quaternary ammonium hydroxide, and an alkanolamine, an optional secondary solvent and less than about 3 wt. % water and/or a dryness coefficient of at least about 1. Methods for the preparation and use of the improved dry stripping solutions are additionally provided. Advantageous solution methods are provided for the use of the novel stripper solutions to prepare an electronic interconnect structure by removing a plurality of resist layers to expose an underlying dielectric and related substrate without imparting damage to any of the underlying structure.
  • Dynamic Multi-Purpose Composition For The Removal Of Photoresists And Method For Its Use

    view source
  • US Patent:
    20090186793, Jul 23, 2009
  • Filed:
    Oct 24, 2006
  • Appl. No.:
    12/091808
  • Inventors:
    Michael T. Phenis - Markleville IN, US
    Lauri Renee Johnson - Greenfield IN, US
    Raymond Chan - Westborough MA, US
    Diane Marie Scheele - Greenwood IN, US
    Kimberly Dona Pollard - Anderson IN, US
    Gene Goebel - Danville CA, US
  • International Classification:
    C11D 7/32
  • US Classification:
    510176, 564296
  • Abstract:
    Improved dry stripper solutions for removing one, two or more photoresist layers from substrates are provided. The stripper solutions comprise dimethyl sulfoxide, a quaternary ammonium hydroxide, and an alkanolamine, an optional secondary solvent and less than about 3 wt. % water and/or a dryness coefficient of at least about 1. Methods for the preparation and use of the improved dry stripping solutions are additionally provided.

Mylife

Michael Phenis Photo 2

Melissa Phenis Wincheste...

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Michael Phenis Michael Phenis Michael Phenis Michael Phenis Michael Phenis
Michael Phenis Photo 3

Eric Phenis Polk City FL

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Michael Phenis Polk City, FL 33 Shawn Phenis Winter Haven, FL 32 Kari Phenis Lakeland, FL 32

Youtube

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X-Men Dark Phoenix Best Scenes starring James McAvoy, Michael Fassbend...

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BPO (Bob Phenis Orchestra)

2009 in Mnchengladbach im "The Pogs" , leider hat sich die Band aufgel...

  • Duration:
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Home Sweet Home

For Treasure Island, 2017. 'Mid pleasures and palaces though we may ro...

  • Duration:
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Victims of the family found murdered include mother Marla Hudgens, her...

  • Duration:
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  • Duration:
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