Michael T Price

US Patent:

7035877, Apr 25, 2006

Filed:

Nov 27, 2002

Appl. No.:

10/306868

Inventors:

Charles Earl Markham - Appleton WI, US
Douglas Gordon Barron Barber - Appleton WI, US
John Harland Hise - Neenah WI, US
Sheryl Annette Ihde - Greenville WI, US
Jeffrey Dean Lindsay - Appleton WI, US
Kurt Sigurd Nygaard - Appleton WI, US
Michael Roy Pokorny - Neenah WI, US
Michael T. Price - Oshkosh WI, US
Walter Caswell Reade - Appleton WI, US
Gregory Duncan Shaffer - Neenah WI, US
Roger Dale Yosten - Sumner TX, US

Assignee:

Kimberly-Clark Worldwide, Inc. - Neenah WI

International Classification:

G06F 17/18

US Classification:

707200, 707202

Abstract:

Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for storing, during a process, data associated with a material. Also disclosed are a method of collecting, storing, and reporting machine productivity, waste, and delay information on an event basis in a manufacturing system, a method of capturing and storing material history, a method of automating tracking of positions of components used in a process and correlating portions of a component with production problems, an improved inventory management system, and a method of tracking and recording actions of specific operators of a process performed by a machine. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.

US Patent:

7882438, Feb 1, 2011

Filed:

Feb 27, 2006

Appl. No.:

11/363476

Inventors:

Charles Earl Markham - Appleton WI, US
Douglas Gordon Barron Barber - Appleton WI, US
John Harland Hise - Neenah WI, US
Sheryl Annette Ihde - Greenville WI, US
Jeffrey Dean Lindsay - Appleton WI, US
Kurt Sigurd Nygaard - Appleton WI, US
Michael Roy Pokorny - Neenah WI, US
Michael T. Price - Oshkosh WI, US
Walter Caswell Reade - Appleton WI, US
Gregory Duncan Shaffer - Neenah WI, US
Roger Dale Yosten - Sumner TX, US

International Classification:

G06F 19/00

US Classification:

715736, 700106, 700109, 700 13, 700 19

Abstract:

Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for storing, during a process, data associated with a material. Also disclosed are a method of collecting, storing, and reporting machine productivity, waste, and delay information on an event basis in a manufacturing system, a method of capturing and storing material history, a method of automating tracking of positions of components used in a process and correlating portions of a component with production problems, an improved inventory management system, and a method of tracking and recording actions of specific operators of a process performed by a machine. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.