Michael A Stuart

US Patent:

61912018, Feb 20, 2001

Filed:

Apr 20, 1998

Appl. No.:

9/051855

Inventors:

Chester P. Jarema - Sterling Heights MI
Michael A. Stuart - Davison MI

Assignee:

Henkel Corporation - Gulph Mills PA

International Classification:

C08K 501
C08K 513
C08K 536
B32B 1508
B32B 2700

US Classification:

524302

Abstract:

A mixture of two stabilizers, one including benzene rings bearing hydroxyl substituents and the other containing divalent sulfur atoms, is effective in stabilizing tacky polymers that remain solid up to a temperature of at least 160. degree. C. particularly polymers of isobutylene, so that the polymers give long service in the ambient atmosphere as protective layers coated on aluminum substrates and used to line the interiors of paint baking ovens. When accumulated foreign materials accumulate on the coatings, the coating and the accumulated foreign materials can be decomposed to largely volatile products by heating to a temperature substantially higher than the service temperature but not high enough to melt the metal substrate for the coating.

US Patent:

59449080, Aug 31, 1999

Filed:

Oct 10, 1996

Appl. No.:

8/728461

Inventors:

Chester P. Jarema - Sterling Heights MI
Michael A. Stuart - Davison MI

Assignee:

Henkel Corporation - Gulph Mills PA

International Classification:

B08B 908

US Classification:

134 2

Abstract:

Residue that accumulates on metallic molding surfaces during repeated molding of plastics such as PVC can be removed by cleaning with an aqueous solution of a glycol or oligo-glycol monoether, an amine, and a chelating agent. The cleaner is sufficiently effective to replace mechanical blasting that was previously required.

US Patent:

20170356956, Dec 14, 2017

Filed:

Aug 7, 2017

Appl. No.:

15/670592

Inventors:

- Everett WA, US
Jordan Schlichting - New Hope MN, US
Thomas McManus - Plymouth MN, US
Peter Bergstrom - Saint Paul MN, US
Lindsey Berdan - Seattle WA, US
Joseph V. Ferrante - Redmond WA, US
Michael Devin Stuart - Issaquah WA, US

International Classification:

G01R 31/28
G06F 11/22

Abstract:

A system for measuring a device under test (DUT) includes a computing device and a measurement device that measures an electrical or physical parameter of the DUT. The computing device receives and stores measurement data in a DUT record associated with the DUT. The computing device further obtains a first image of the DUT, displays the first image as a reference image with a first reference frame, receives a live image of the DUT from an image sensor, and displays the live image with a second reference frame that corresponds to the first reference frame. A cursor on the live image moves according to movement of the image sensor relative to the DUT. A second image of the DUT is obtained, wherein the second image is substantially aligned with the reference image based on an alignment of the cursor with the second reference frame. The second image is stored in the DUT record.