Polymers • Characterization • Materials • Materials Science • Design of Experiments • Composites • Engineering • Manufacturing • Nanotechnology • Research and Development • Semiconductors • Scanning Electron Microscopy • Statistical Process Control
Intel Corporation
Senior Process and Packaging R and D Engineer
Georgia Institute of Technology Aug 2004 - May 2010
Graduate Research Assistant
Education:
Georgia Institute of Technology 2004 - 2010
Doctorates, Doctor of Philosophy, Engineering
Clemson University
Master of Science, Masters, Materials Science, Engineering
Department of Technology, Savitribai Phule Pune University
Bachelor of Engineering, Bachelors, Engineering
Skills:
Polymers Characterization Materials Materials Science Design of Experiments Composites Engineering Manufacturing Nanotechnology Research and Development Semiconductors Scanning Electron Microscopy Statistical Process Control
Us Patents
Inkjet Printable Mask Apparatus And Method For Solder On Die Technology
Described is an apparatus which comprises: a die with a first side; a plurality of metal bumps on the first side of the die; a plurality of solders disposed on the plurality of metal bumps; and a patterned printable resist disposed next to at least one of the solders of the plurality of solders. Described is a method which comprises: printing a photoresist ink onto a bumped wafer surface; thermally or Ultra-Violet curing the photoresist ink; and printing or electroplating solder(s) onto the bumped wafer surface. Described is a machine readable storage media having one or more instructions that when executed cause a machine to perform an operations according to the method described above.
Laser Die Backside Film Removal For Integrated Circuit (Ic) Packaging
- SANTA CLARA CA, US Edward R. Prack - Phoenix AZ, US Sergei L. Voronov - Chandler AZ, US Tony Dambrauskas - Chandler AZ, US Lars D. Skoglund - Chandler AZ, US Yoshihiro Tomita - Tsukuba, JP Mihir A. Oka - Chandler AZ, US Rajen C. Dias - Phoenix AZ, US
Embodiments of the present disclosure are directed to die adhesive films for integrated circuit (IC) packaging, as well as methods for forming and removing die adhesive films and package assemblies and systems incorporating such die adhesive films. A die adhesive film may be transparent to a first wavelength of light and photoreactive to a second wavelength of light. In some embodiments, the die adhesive film may be applied to a back or “inactive” side of a die, and the die surface may be detectable through the die adhesive film. The die adhesive film may be cured and/or marked with laser energy having the second wavelength of light. The die adhesive film may include a thermochromic dye and/or nanoparticles configured to provide laser mark contrast. UV laser energy may be used to remove the die adhesive film in order to expose underlying features such as TSV pads.
Techniques are disclosed for protecting a surface using a dry-removable protective coating that does not require chemical solutions to be removed. In an embodiment, a protective layer is disposed on a surface. The protective layer is composed of one layer that adheres to the surface. The surface is then processed while the protective coating is on the surface. Thereafter, the protective layer is removed from the surface by separating the protective layer away from the surface without the use of chemical solutions.
Solder-On-Die Using Water-Soluble Resist System And Method
Mihir Oka - Chandler AZ, US Xavier Brun - Chandler AZ, US Dingying David Xu - Chandler AZ, US Edward Prack - Phoenix AZ, US Kabirkumar Mirpuri - Scottsdale AZ, US Saikumar Jayaraman - Chandler AZ, US
This disclosure relates generally to generating a solder-on-die using a water-soluble resist, system, and method. Heat may be applied to solder as applied to a hole formed in a water-soluble resist coating, the water-soluble resist coating being on a surface of an initial assembly. The initial assembly may include an electronic component. The surface may be formed, at least in part, by an electrical terminal of the electronic component, the hole being aligned, at least in part, with the electrical terminal. The solder may be reflowed, wherein the solder couples, at least in part, with the electrical terminal.
Laser Die Backside Film Removal For Integrated Circuit (Ic) Packaging
Danish Faruqui - Chandler AZ, US Edward R. Prack - Phoenix AZ, US Sergei L. Voronov - Chandler AZ, US Tony Dambrauskas - Chandler AZ, US Lars D. Skoglund - Chandler AZ, US Yoshihiro Tomita - Tsukuba, JP Mihir A. Oka - Chandler AZ, US Rajen C. Dias - Phoenix AZ, US
International Classification:
H01L 23/00
US Classification:
257783, 438118
Abstract:
Embodiments of the present disclosure are directed to die adhesive films for integrated circuit (IC) packaging, as well as methods for forming and removing die adhesive films and package assemblies and systems incorporating such die adhesive films. A die adhesive film may be transparent to a first wavelength of light and photoreactive to a second wavelength of light. In some embodiments, the die adhesive film may be applied to a back or “inactive” side of a die, and the die surface may be detectable through the die adhesive film. The die adhesive film may be cured and/or marked with laser energy having the second wavelength of light. The die adhesive film may include a thermochromic dye and/or nanoparticles configured to provide laser mark contrast. UV laser energy may be used to remove the die adhesive film in order to expose underlying features such as TSV pads.
Methods To Improve Laser Mark Contrast On Die Backside Film In Embedded Die Packages
Mihir A. Oka - Chandler AZ, US Rahul N. Manepalli - Chandler AZ, US Dingying Xu - Maricopa AZ, US Yosuke Kanaoka - Tsukuba, JP Sergei L. Voronov - Chandler AZ, US Dong Hai Sun - Chandler AZ, US
International Classification:
H01L 23/48 H01L 21/02
US Classification:
257773, 438401
Abstract:
Apparatus including a die including a device side with contact points; and a build-up carrier disposed on the device side of the die; and a film disposed on the back side of the die, the film including a markable material including a mark contrast of at least 20 percent. Method including forming a body of a build-up carrier adjacent a device side of a die; and forming a film on a back side of the die, the film including a markable material including a mark contrast of at least 20 percent. Apparatus including a package including a microprocessor disposed in a carrier; a film on the back side of the microprocessor, the film including a markable material including a mark contrast of at least 20 percent; and a printed circuit board coupled to at least a portion of the plurality of conductive posts of the carrier.
A die backside film including a matrix material; and an amount of filler particles to render the die backside film thermally conductive, wherein a thermal conductivity of the amount of filler particles is greater than a thermal conductivity of silica particles. A method including introducing a die backside film on a backside surface of a die, the die backside film including a matrix material including an elastomer an amount of filler particles to render the die backside film thermally conductive, wherein a thermal conductivity of the amount of filler particles is greater than a thermal conductivity of silica particles; and disposing the die in a package.
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