Nathan P Cook

US Patent:

20190003969, Jan 3, 2019

Filed:

Jan 13, 2016

Appl. No.:

16/069107

Inventors:

- Muenchen, DE
Nathan P. COOK - Williamstown MA, US

International Classification:

G01N 21/64

Abstract:

An emission lifetime measuring method, in particular for measuring a mean lifetime of electronically excited states of a sample, comprises the steps of illuminating the sample with at least one excitation light pulse, time-resolved detecting an emission response from the sample and creating a temporal detector response function, and calculating the mean lifetime of the electronically excited states on the basis of the detector response function, wherein the at least one excitation light pulse is shaped such that the sample achieves an equilibrium excited steady-state including a linearly increasing or constant number of the electronically excited states, the detector response function has a linear response function section with a constant slope, and the mean lifetime (τ) of the electronically Diode current and pulse width control excited states is calculated on the basis of at least one of a time position of the linear response function section relative to a reference time of the at least one excitation light pulse and the slope of the linear response function section. Furthermore, an emission lifetime measuring apparatus () is described.