Nathan D Sharp

US Patent:

20140047922, Feb 20, 2014

Filed:

Mar 15, 2012

Appl. No.:

14/004594

Inventors:

Douglas E. Adams - West Lafayette IN, US
Nathan D. Sharp - West Lafayette IN, US
Ronald Sterkenburg - West Lafayette IN, US

Assignee:

PURDUE RESEARCH FOUNDATION - West Lafayette IN

International Classification:

G01N 29/11

US Classification:

73588, 738656

Abstract:

Apparatuses and methods are disclosed for determining whether a structure of bonded layers includes locations where the layers are weakly bonded. Embodiments include evaluating the frequency response of the structure in response to vibrational inputs. Alternate embodiments include evaluating the non-linear response of the structure using a modal analysis. Further embodiments include obtaining the vibrational information with an accelerometer contacting the structure, while additional embodiments include exciting the structure with an impact force, which may be applied at multiple locations on the structure's surface. Still further embodiments include performing a MAC, COMAC, and/or FRF analysis. Still other embodiments include varying the amplitude of the input vibration. Additional embodiments locate the areas of weakened bonding. Still other embodiments include methods and apparatuses for simulating a laminated structure with defective bonding, such as kiss bonding.

US Patent:

20140294036, Oct 2, 2014

Filed:

Oct 25, 2012

Appl. No.:

14/353713

Inventors:

- West Lafayette IN, US
Douglas E. Adams - Brentwood TN, US
Anand David - Woodbury MN, US
Peter R. O'Regan - West Lafayette IN, US
Farshid Sadeghi - West Lafayette IN, US
Nathan Daniel Sharp - West Lafayette IN, US
Mark David Suchomel - Sugar Grove IL, US

Assignee:

Purdue Research Foundation - West Lafayette IN

International Classification:

G01N 25/72

US Classification:

374 5

Abstract:

Methods and apparatus for the detection of irregularities in a thin film by measurement of transient thermal response.