7709 Eagle Rock Ave, Albuquerque, NM 87122 • 5058582570
3821 Faversham Rd, Cleveland, OH 44118
University Heights, OH
New York, NY
University Ht, OH
7709 Eagle Rock Ave NE, Albuquerque, NM 87122
Work
Company:
Emcore
Nov 1998
Position:
Vice president, business development
Education
School / High School:
Case Western Reserve University
1980 to 1987
Skills
Photovoltaics • Semiconductors • Program Management • Engineering Management • Physics • Semiconductor Industry • Start Ups • Solar Cells • R&D • Engineering • Characterization • Systems Engineering • Optics • Sensors • Electronics • Solar Energy • Business Development • Product Management • New Business Development • Cross Functional Team Leadership • Design of Experiments • Failure Analysis • Spc • Simulations • Manufacturing • Business Strategy • Thin Films • Product Engineering • Research and Development
Languages
Persian
Industries
Semiconductors
Us Patents
Apparatus And Method For Optimizing The Efficiency Of Germanium Junctions In Multi-Junction Solar Cells
Mark A. Stan - Albuquerque NM, US Nein Y. Li - Sunnyvale CA, US Frank A. Spadafora - Baden PA, US Hong Q. Hou - Albuquerque NM, US Paul R. Sharps - Albuquerque NM, US Navid S. Fatemi - Albuquerque NM, US
Assignee:
Emcore Corporation - Albuquerque NM
International Classification:
H01L 31/0216 H01L 31/0256
US Classification:
136256, 136262
Abstract:
Apparatus and Method for Optimizing the Efficiency of Germanium Junctions in Multi-Junction Solar Cells. In a preferred embodiment, an indium gallium phosphide (InGaP) nucleation layer is disposed between the germanium (Ge) substrate and the overlying dual-junction epilayers for controlling the diffusion depth of the n-doping in the germanium junction. Specifically, by acting as a diffusion barrier to arsenic (As) contained in the overlying epilayers and as a source of n-type dopant for forming the germanium junction, the nucleation layer enables the growth time and temperature in the epilayer device process to be minimized without compromising the integrity of the dual-junction epilayer structure. This in turn allows the arsenic diffusion into the germanium substrate to be optimally controlled by varying the thickness of the nucleation layer. An active germanium junction formed in accordance with the present invention has a typical diffused junction depth that is ⅕ to of that achievable in prior art devices.
Method And Apparatus Of Multiplejunction Solar Cell Structure With High Band Gap Heterojunction Middle Cell
A method and a multijunction solar device having a high band gap heterojunction middle solar cell are disclosed. In one embodiment, a triple-junction solar device includes bottom, middle, and top cells. The bottom cell has a germanium (Ge) substrate and a buffer layer, wherein the buffer layer is disposed over the Ge substrate. The middle cell contains a heterojunction structure, which further includes an emitter layer and a base layer that are disposed over the bottom cell. The top cell contains an emitter layer and a base layer disposed over the middle cell.
Controlling Dopant Diffusion In A Semiconductor Region
Mark A. Stan - Albuquerque NM, US Nein Y. Li - Sunnyvale CA, US Frank A. Spadafora - Albuquerque NM, US Hong Q. Hou - Albuquerque NM, US Paul R. Sharps - Albuquerque NM, US Navid S. Fatemi - Albuquerque NM, US
Assignee:
Emcore Solar Power, Inc. - Albuquerque NM
International Classification:
H01L 21/22
US Classification:
438542, 438558, 257E33028
Abstract:
Dopant diffusion into semiconductor material is controlled during fabrication of a semiconductor structure by depositing a nucleation layer over a first layer of the semiconductor structure and depositing a device layer containing the dopant over the nucleation layer. The nucleation layer serves as a diffusion barrier by limiting in depth the diffusion of the dopant into the first layer. The dopant can include arsenic (As).
Method Of Forming A Multijunction Solar Cell Structure With A Gaas/Aigaas Tunnel Diode
A method of forming a multijunction solar cell includes providing a substrate, forming a first subcell by depositing a nucleation layer over the substrate and a buffer layer including gallium arsenide (GaAs) over the nucleation layer, forming a middle second subcell having a heterojunction base and emitter disposed over the first subcell and forming first and second tunnel junction layers between the first and second subcells. The first tunnel junction layer includes GaAs over the first subcell and the second tunnel junction layer includes aluminum gallium arsenide (AlGaAs) over the first tunnel junction layer. The method further includes forming a third subcell having a homojunction base and emitter disposed over the middle subcell.
Method And Apparatus Of Multiplejunction Solar Cell Structure With High Band Gap Heterojunction Middle Cell
Navid Fatemi - Albuquerque NM, US Daniel Aiken - Cedar Crest NM, US Mark Stan - Albuquerque NM, US
International Classification:
H01L031/0336
US Classification:
257/200000
Abstract:
A method and a multijunction solar device having a high band gap heterojunction middle solar cell are disclosed. In one embodiment, a triple-junction solar device includes bottom, middle, and top cells. The bottom cell has a germanium (Ge) substrate and a buffer layer, wherein the buffer layer is disposed over the Ge substrate. The middle cell contains a heterojunction structure, which further includes an emitter layer and a base layer that are disposed over the bottom cell. The top cell contains an emitter layer and a base layer disposed over the middle cell.
Apparatus And Method For Optimizing The Efficiency Of Germanium Junctions In Multi-Junction Solar Cells
Mark A. Stan - Albuquerque NM, US Nein Y. Li - Albuquerque NM, US Frank A. Spadafora - Baden PA, US Hong Q. Hou - Arcadia CA, US Paul R. Sharps - Albuquerque NM, US Navid S. Fatemi - Albuquerque NM, US
Assignee:
EMCORE CORPORATION - Albuquerque NM
International Classification:
H01L 31/06 H01L 31/0216
US Classification:
136262, 136255
Abstract:
Apparatus and Method for Optimizing the Efficiency of Germanium Junctions in Multi-Junction Solar Cells. In a preferred embodiment, an indium gallium phosphide (InGaP) nucleation layer is disposed between the germanium (Ge) substrate and the overlying dual-junction epilayers for controlling the diffusion depth of the n-doping in the germanium junction. Specifically, by acting as a diffusion barrier to arsenic (As) contained in the overlying epilayers and as a source of n-type dopant for forming the germanium junction, the nucleation layer enables the growth time and temperature in the epilayer device process to be minimized without compromising the integrity of the dual-junction epilayer structure. This in turn allows the arsenic diffusion into the germanium substrate to be optimally controlled by varying the thickness of the nucleation layer. An active germanium junction formed in accordance with the present invention has a typical diffused junction depth that is ⅕ to of that achievable in prior art devices. Furthermore, triple-junction solar cells incorporating a shallow n-p germanium junction of the present invention can attain 1 sun AMO efficiencies in excess of 26%.
Method Of Fabricating A Multijunction Solar Cell With A Phosphorus-Containing Nucleation Layer
Mark A. Stan - Albuquerque NM, US Nein Y. Li - Albuquerque NM, US Frank A. Spadafora - Baden PA, US Hong Q. Hou - Arcadia CA, US Paul R. Sharps - Albuquerque NM, US Navid S. Fatemi - Albuquerque NM, US
Assignee:
Emcore Solar Power, Inc. - Albuquerque NM
International Classification:
H01L 31/18 H01L 21/22
US Classification:
438 87, 438 93, 257E21135, 257E31005
Abstract:
A multijunction solar cell is fabricated according to an embodiment by providing a substrate, depositing a nucleation first layer over and directly in contact with the substrate, depositing a second layer containing an arsenic dopant over the nucleation layer and depositing a sequence of layers over the second layer forming at least one solar subcell. The nucleation layer serves as a diffusion barrier to the arsenic dopant such that diffusion of the arsenic dopant into the substrate is limited in depth by the nucleation layer.
Low Resistance Contacts For Shallow Junction Semiconductors
Navid S. Fatemi - University Heights OH Victor G. Weizer - Cleveland Heights OH
Assignee:
Sverdrup Technology, Inc. - Tullahoma TN
International Classification:
H01L 2348
US Classification:
257745
Abstract:
A method of enhancing the specific contact resistivity in InP semiconductor devices and improved devices produced thereby are disclosed. Low resistivity values are obtained by using gold ohmic contacts that contain small amounts of gallium or indium and by depositing a thin gold phosphide interlayer between the surface of the InP device and the ohmic contact. When both the thin interlayer and the gold-gallium or gold-indium contact metallizations are used, ultra low specific contact resistivities are achieved. Thermal stability with good contact resistivity is achieved by depositing a layer of refractory metal over the gold phosphide interlayer.
Emcore since Nov 1998
Vice President, Business Development
Essential Research, Inc. 1994 - 1998
Co-Owner
NASA Glenn Research Center 1987 - 1994
Research Scientist
Education:
Case Western Reserve University 1980 - 1987
Skills:
Photovoltaics Semiconductors Program Management Engineering Management Physics Semiconductor Industry Start Ups Solar Cells R&D Engineering Characterization Systems Engineering Optics Sensors Electronics Solar Energy Business Development Product Management New Business Development Cross Functional Team Leadership Design of Experiments Failure Analysis Spc Simulations Manufacturing Business Strategy Thin Films Product Engineering Research and Development
Languages:
Persian
Name / Title
Company / Classification
Phones & Addresses
Navid Fatemi Director-marketing Sales And Programs
EMCORE CORPORATION Semiconductors and Related Devices
10420 Research Rd SE, Albuquerque, NM 87123 10420 Research Rd Se , Albuquerque, NM 87123 1420 Research Rd SE, Albuquerque, NM 87123 5053325000, 5053325038, 5053325079