Neil B Bromberg

Deceased

from Saint Louis, MO

Also known as:
  • Neil Bromberg Susan
  • Mnal B Bromberg

Neil Bromberg Phones & Addresses

  • Saint Louis, MO
  • 1833 Hi Mount Blvd, Milwaukee, WI 53208 • 4147712427
  • Rochester, NY
  • 1833 N Hi Mount Blvd, Milwaukee, WI 53208 • 4144774370

Education

  • Degree:
    High school graduate or higher

Emails

Us Patents

  • Higher Order Detector Z-Slope Correction For A Multislice Computed Tomography System

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  • US Patent:
    6055290, Apr 25, 2000
  • Filed:
    Aug 25, 1998
  • Appl. No.:
    9/139992
  • Inventors:
    Min Xie - Waukesha WI
    Guy M. Besson - Wauwatosa WI
    Neil B. Bromberg - Milwaukee WI
  • Assignee:
    General Electric Company - Milwaukee WI
  • International Classification:
    A61B 603
  • US Classification:
    378 4
  • Abstract:
    The present invention comprises a system and method for correcting for z-slope variations in detector cell outputs represented by data obtained by a scan in a CT system. According to one aspect of the invention, a final error factor, based upon a combination of a correction factor and an initial error factor, is applied to the data. The correction factor having a computational complexity independent of the order of correction desired. The present invention transfers all of the computational complexity of z-slope correction to a calibration process, thereby improving the computational speed and efficiency of producing an accurate image based on the scan data. In another aspect, the present invention improves image quality by providing a correction factor comprising a plurality of channel correction factors, where each of the plurality of channels is the center channel for a corresponding moving segment used to respectively determine each of the channel correction factors.
  • Sampling Rate Scaling Of Calibration Vectors In X-Ray Ct Machines

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  • US Patent:
    6411673, Jun 25, 2002
  • Filed:
    Dec 29, 2000
  • Appl. No.:
    09/751814
  • Inventors:
    Neil B. Bromberg - Milwaukee WI
  • Assignee:
    GE Medical Systems Global Technology Company, LLC - Waukesha WI
  • International Classification:
    A61B 603
  • US Classification:
    378 19, 378 8, 378901
  • Abstract:
    Time consuming calibration of a multi-element x-ray detector for an x-ray computed tomography machine that has multi-sample rate capabilities is reduced by determining through the use of air-scans, a scalar relationship between sensitivity of detector elements as a function of sampling rate. This scalar relationship is in vector form and may be applied to independently obtain calibration vectors at a base scan rate to provide effective calibration vectors at a variety of scan rates without the need for time consuming daily calibration scans at each of those sample rates.
  • Methods And Apparatus For Calibrating Ct X-Ray Beam Tracking Loop

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  • US Patent:
    6411677, Jun 25, 2002
  • Filed:
    Sep 10, 2001
  • Appl. No.:
    09/950261
  • Inventors:
    Thomas L. Toth - Brookfield WI
    George E. Seidenschnur - Waukesha WI
    Neil B. Bromberg - Milwaukee WI
  • Assignee:
    General Electric Company - Schenectady NY
  • International Classification:
    G21K 102
  • US Classification:
    378147, 378 4
  • Abstract:
    The present invention is, in one embodiment, a method for determining tracking control parameters for positioning an x-ray beam of a computed tomography imaging system having a movable collimator positionable in steps and a detector array including a plurality of rows of detector elements. The method includes steps of obtaining detector samples at a series of collimator step positions while determining a position of a focal spot of the x-ray beam; determining a beam position for each detector element at each collimator step utilizing the determined focal spot positions, a nominal focal spot length, and geometric parameters of the x-ray beam, collimator, and detector array; and determining a calibration parameter utilizing information so obtained. For example, in determining a target beam position at which to maintain the x-ray beam, a detector element differential error is determined according to ratios of successive collimator step positions; and a target beam position is selected for an isocenter element in accordance with the determined element differential errors.
  • Methods For Spectrally Calibrating Ct Imaging Apparatus Detectors

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  • US Patent:
    7086780, Aug 8, 2006
  • Filed:
    May 20, 2004
  • Appl. No.:
    10/850009
  • Inventors:
    Xiaoye Wu - Rexford NY, US
    Neil Barry Bromberg - Milwaukee WI, US
    Alexander Kolker - Milwaukee WI, US
    Piero Ugo Simoni - Greenfield WI, US
    Thomas Louis Toth - Brookfield WI, US
  • Assignee:
    General Electric Company - Schenectady NY
  • International Classification:
    G01D 18/00
  • US Classification:
    378207, 378 5, 378 18, 378 19, 25036309
  • Abstract:
    A method for calibrating a computed tomographic imaging apparatus having a gantry, a radiation source operable at a plurality of kVp's, and a detector array having a plurality of detector elements includes using a system detection function to estimate signals of each detector element that would have been detected through air and through a given thickness of water to determine estimated datasets. The estimated datasets are used to determine data pair sets each comprising a normalized water projection value and an ideal projection value for each detector element. The method further includes determining and storing a representation of a mapping function of the normalized water projections values to the ideal projection values in a memory of the computed tomographic imaging apparatus as a spectral calibration of the computed tomographic imaging apparatus.
  • Method And Apparatus For Correcting For Beam Hardening In Ct Images

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  • US Patent:
    7391844, Jun 24, 2008
  • Filed:
    Jan 14, 2005
  • Appl. No.:
    11/036618
  • Inventors:
    Xiaoye Wu - Rexford NY, US
    Piero Ugo Simoni - Greenfield WI, US
    Thomas Louis Toth - Brookfield WI, US
    Neil Barry Bromberg - Milwaukee WI, US
  • Assignee:
    General Electric Company - Schenectady NY
  • International Classification:
    A61B 6/00
  • US Classification:
    378 18, 378207
  • Abstract:
    A method for determining a correction for beam hardening in CT images includes obtaining air scans at a plurality of kVp's, determining detection efficiencies for detector elements of the CT imaging apparatus, and estimating projection values through a combination of at least two different materials of different thicknesses. The method further includes determining a transfer function that translates the estimated projection values into ideal projection values for at least two of the different materials and storing the transfer function as the beam hardening correction for images of the CT imaging apparatus.
  • Methods And Apparatus For Calibrating Ct X-Ray Beam Tracking Loop

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  • US Patent:
    63109387, Oct 30, 2001
  • Filed:
    Aug 27, 1999
  • Appl. No.:
    9/384937
  • Inventors:
    Thomas L. Toth - Brookfield WI
    George E. Seidenschnur - Waukesha WI
    Neil B. Bromberg - Milwaukee WI
  • Assignee:
    General Electric Company - Schenectady NY
  • International Classification:
    G21K 100
  • US Classification:
    378147
  • Abstract:
    The present invention is, in one embodiment, a method for determining tracking control parameters for positioning an x-ray beam of a computed tomography imaging system having a movable collimator positionable in steps and a detector array including a plurality of rows of detector elements. The method includes steps of obtaining detector samples at a series of collimator step positions while determining a position of a focal spot of the x-ray beam; determining a beam position for each detector element at each collimator step utilizing the determined focal spot positions, a nominal focal spot length, and geometric parameters of the x-ray beam, collimator, and detector array; and determining a calibration parameter utilizing information so obtained. For example, in determining a target beam position at which to maintain the x-ray beam, a detector element differential error is determined according to ratios of successive collimator step positions; and a target beam position is selected for an isocenter element in accordance with the determined element differential errors.
  • Methods And Apparatus For Monitoring Detector Image Quality

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  • US Patent:
    63273292, Dec 4, 2001
  • Filed:
    Aug 25, 1998
  • Appl. No.:
    9/140110
  • Inventors:
    Neil B. Bromberg - Milwaukee WI
    Hui David He - Waukesha WI
    Mary Sue Kulpins - New Berlin WI
  • Assignee:
    General Electric Company - Schenectady NY
  • International Classification:
    A61B 600
    H05B 164
    G01D 1800
  • US Classification:
    378 19
  • Abstract:
    Methods and apparatus for detecting cell to cell variation to ensure that the maximum allowable channel to channel variation is not exceeded are described. In one embodiment, an algorithm is periodically executed to measure the relative gains in the channels. The gains are measured, for example, by recording the signal from an air scan and normalizing to a common reference. Part of the normalization process includes accounting for the non uniformity of the x-ray beam, for example, the heel effect. It is assumed that the x-ray flux profile in z is slowly changing in the x-direction and is obtained by low pass filtering in x. The normalized values are then compared to a predetermined specification. If any particular cell is not within the specification parameters, then the module in which such cell resides may be replaced. In addition to measuring gain variation and comparing it to a specification, a trending analysis also may be performed.
  • Calibration Simplification For A Computed Tomograph System

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  • US Patent:
    63255391, Dec 4, 2001
  • Filed:
    Jul 19, 1999
  • Appl. No.:
    9/356535
  • Inventors:
    Neil B. Bromberg - Milwaukee WI
  • Assignee:
    General Electric Company - Schenectady NY
  • International Classification:
    A61B 603
  • US Classification:
    378207
  • Abstract:
    Methods and apparatus for calibration simplification in a computed tomography (CT) system are described. In one embodiment, the CT system utilizes calibration values from a first scan type, or mode of operation, to determine calibration values for at least a second scan type. As a result, the time required to perform calibration of the CT system is reduced.

Classmates

Neil Bromberg Photo 1

Neil Bromberg

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Schools:
Saddle River Country Day Saddle River NJ 1978-1981
Community:
Glendon Kushner, Nancy Felber, Rachel Smith, Felicia Ribman, Liese Plenge, Gregory Lachica, Jeffrey Miner, Connie Fransis, Adam Berman, Wendy Greulich

Googleplus

Neil Bromberg Photo 2

Neil Bromberg

Youtube

"Jungle Boogie" Neil Zaza, Bobby Rock, Brian ...

"Jungle Boogie" was captured at Jam Camp in Park City, Utah on June 18...

  • Category:
    Music
  • Uploaded:
    23 Jun, 2008
  • Duration:
    4m 3s

"Jungle Boogie" Neil Zaza, Bobby Rock, Brian ...

"Jungle Boogie" was captured at Jam Camp in Park City, Utah on June 18...

  • Category:
    Music
  • Uploaded:
    23 Jun, 2008
  • Duration:
    9m 1s

"Jungle Boogie" Neil Zaza, Bobby Rock, Brian ...

"Jungle Boogie" was captured at Jam Camp in Park City, Utah on June 18...

  • Category:
    Music
  • Uploaded:
    23 Jun, 2008
  • Duration:
    9m 7s

Neil Zaza and Brian Bromberg at Carvin NAMM 2...

Neil Zaza and Brian Bromberg did an unplanned jam at Carvin's NAMM boo...

  • Category:
    Music
  • Uploaded:
    17 Jan, 2011
  • Duration:
    8m 9s

"Blues in A" : Virgil Donati, Neil Zaza and f...

This is a blues jam that was captured at Jam Camp in Park City, Utah o...

  • Category:
    Music
  • Uploaded:
    22 Jun, 2008
  • Duration:
    9m 22s

Neil Zaza and Brian Bromberg jamming at the C...

Video I took of Neil and Brian Jamming at Carvin at the 2011 NAMM show...

  • Category:
    Music
  • Uploaded:
    16 Jan, 2011
  • Duration:
    1m 9s

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