Neil J Simpson

US Patent:

7120842, Oct 10, 2006

Filed:

Sep 22, 2003

Appl. No.:

10/667879

Inventors:

Gordhan Barevadia - Richardson TX, US
Anupama Aniruddha Agashe - Pune, IN
Nikila Krishnamoorthy - Bangalore, IN
Rubin Ajit Parekhji - Bangalore, IN
Neil J. Simpson - Rockwall TX, US

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G01R 31/28

US Classification:

714726, 714733

Abstract:

A system and method enhance observability of IC failures during burn-in tests. Scan automatic test pattern generation and memory built-in self-test patterns are monitored during the burn-in tests to provide a mechanism for observing selective scan chain outputs and memory BIST status outputs.

US Patent:

20050246599, Nov 3, 2005

Filed:

Apr 30, 2004

Appl. No.:

10/836931

Inventors:

Neil Simpson - Rockwall TX, US
Rakesh Kumar - Bangalore, IN

International Classification:

G01R031/28

US Classification:

714724000

Abstract:

A system for testing input characteristics of an integrated circuit device includes an integrated circuit device. The integrated circuit device includes, an input pad, an output pad, an input register, and a data register. The input register receives an input value from the input pad and communicates the input value to a portion of the integrated circuit for processing when the integrated circuit is not in test mode. The data register receives a test value from the input register and communicates the test value to the output pad when the integrated circuit is in test mode.

US Patent:

20060242508, Oct 26, 2006

Filed:

Apr 26, 2005

Appl. No.:

11/115459

Inventors:

Neil Simpson - Rockwall TX, US
Divya Reddy - Richardson TX, US
Hari Balachandran - Allen TX, US

Assignee:

Texas Instruments Incorporation - Dallas TX

International Classification:

G01R 31/28

US Classification:

714726000

Abstract:

A system 100 for scan testing at least two substantially identical modules 140 and 150 within an integrated circuit is provided. The system 100 includes a first module 140 to receive and process scan input and produce a first scan output. The system 100 includes a second module 150 substantially similar to the first module 140. The second module 150 receives and processes scan input and produces a second scan output. The system 100 also includes a first component 180 to receive the first and second scan outputs and to produce a first output. The first output is used to determine whether the first and second modules 140 and 150 are functioning properly.