Gordhan Barevadia - Richardson TX, US Anupama Aniruddha Agashe - Pune, IN Nikila Krishnamoorthy - Bangalore, IN Rubin Ajit Parekhji - Bangalore, IN Neil J. Simpson - Rockwall TX, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G01R 31/28
US Classification:
714726, 714733
Abstract:
A system and method enhance observability of IC failures during burn-in tests. Scan automatic test pattern generation and memory built-in self-test patterns are monitored during the burn-in tests to provide a mechanism for observing selective scan chain outputs and memory BIST status outputs.
System And Method For Testing Input And Output Characterization On An Integrated Circuit Device
Neil Simpson - Rockwall TX, US Rakesh Kumar - Bangalore, IN
International Classification:
G01R031/28
US Classification:
714724000
Abstract:
A system for testing input characteristics of an integrated circuit device includes an integrated circuit device. The integrated circuit device includes, an input pad, an output pad, an input register, and a data register. The input register receives an input value from the input pad and communicates the input value to a portion of the integrated circuit for processing when the integrated circuit is not in test mode. The data register receives a test value from the input register and communicates the test value to the output pad when the integrated circuit is in test mode.
Neil Simpson - Rockwall TX, US Divya Reddy - Richardson TX, US Hari Balachandran - Allen TX, US
Assignee:
Texas Instruments Incorporation - Dallas TX
International Classification:
G01R 31/28
US Classification:
714726000
Abstract:
A system 100 for scan testing at least two substantially identical modules 140 and 150 within an integrated circuit is provided. The system 100 includes a first module 140 to receive and process scan input and produce a first scan output. The system 100 includes a second module 150 substantially similar to the first module 140. The second module 150 receives and processes scan input and produces a second scan output. The system 100 also includes a first component 180 to receive the first and second scan outputs and to produce a first output. The first output is used to determine whether the first and second modules 140 and 150 are functioning properly.
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Neil Simpson Owner
Neil Simpson Construction Contractors-Alteration & Renovation
11565 77A Ave, Delta, BC V4C 1M6 6048160631
Neil Simpson Owner
Neil Simpson Construction Contractors-Alteration & Renovation