Dr. Kelley graduated from the Medical College of Wisconsin School of Medicine in 1986. He works in Indianapolis, IN and specializes in Pediatrics. Dr. Kelley is affiliated with IU Health North Hospital and IU Health University Hospital.
Craniofacial & Reconstructive Plastic Surgery Center 1301 Barbara Jordan Blvd STE 301, Austin, TX 78723 5123240915 (phone), 5123240644 (fax)
Education:
Medical School Baylor College of Medicine Graduated: 1998
Procedures:
Skull/Facial Bone Fractures and Dislocations Cleft Lip or Nasal Deformity Repair Cleft Palate Correction Hernia Repair Rhinoplasty Skin Tags Removal Tracheostomy
Conditions:
Cleft Palate and Cleft Lip Skin Cancer Tempromandibular Joint Disorders (TMJ)
Languages:
English Spanish
Description:
Dr. Kelley graduated from the Baylor College of Medicine in 1998. He works in Austin, TX and specializes in Plastic Surgery. Dr. Kelley is affiliated with Dell Childrens Medical Center.
Plastic Surgery Center 15 Doctors Dr, Panama City, FL 32405 8507698991 (phone), 8507693708 (fax)
Education:
Medical School Loyola University Chicago Stritch School of Medicine Graduated: 1972
Procedures:
Breast Reconstruction Breast Reduction Rhinoplasty Cleft Lip or Nasal Deformity Repair Skull/Facial Bone Fractures and Dislocations
Languages:
English
Description:
Dr. Kelley graduated from the Loyola University Chicago Stritch School of Medicine in 1972. He works in Panama City, FL and specializes in Plastic Surgery. Dr. Kelley is affiliated with Gulf Coast Regional Medical Center.
Peter R. Anderson - Glenview IL, US Rory L. Block - Carson City NV, US Joel R. Jaffe - Glenview IL, US Shridhar P. Joshi - Naperville IL, US Vincent Chan - Vancouver, CA Patrick H. Kelley - Evanston IL, US Richard T. Schwartz - Chicago IL, US Byron A. Uytiepo - Chicago IL, US
Assignee:
WMS Gaming Inc. - Waukegan IL
International Classification:
A63F 9/24
US Classification:
463 40
Abstract:
A gaming system and method of conducting a wagering game having a fantasy-sports feature on a gaming system is disclosed. A wager is received from a user to play the wagering game. A roster having one or more player is created, via user selection. A projected team score and an actual team score for the created roster are determined. A ratio is calculated for the actual team score to the projected team score. An award is provided to the user if the calculated ratio meets a predetermined criterion.
Method Of Manufacturing A Flash Memory Cell Having Inter-Poly-Dielectric Isolation
Patrick J. Kelley - Orlando FL Ranbir Singh - Orlando FL Larry B. Fritzinger - Orlando FL Cynthia C. Lee - Orlando FL John Simon Molloy - Orlando FL
Assignee:
Agere Systems Guardian Corp. - Orlando FL
International Classification:
H01L 31336
US Classification:
438257
Abstract:
A method of forming round corners for a gate oxide between a floating gate and a control gate of a memory cell comprises the steps of forming the floating gate over a tunnel oxide; forming a mask over the floating gate; forming rounded end caps adjacent distal ends of the mask; transferring the rounding of the end caps to top corners of the floating gate; forming the gate oxide over the floating gate; and, forming the control gate over the gate oxide. A memory cell having a rounded corner interface between the floating gate and control gate is also provided.
Erasable Memory Device And An Associated Method For Erasing A Memory Cell Therein
Patrick J. Kelley - Orlando FL Chung Wai Leung - Orlando FL Ranbir Singh - Orlando FL
Assignee:
Agere Systems Guardian Corp. - Murray Hill NJ
International Classification:
G11C 1604
US Classification:
36518507
Abstract:
An electrically erasable memory device includes a substrate and a plurality of single poly layer memory cells in the substrate. Each single poly layer memory cell includes a first MOS transistor in a first region in the substrate and spaced apart source and drain regions. Each single poly layer memory cell further includes a capacitor having a first electrode overlying a second region in the substrate and an insulating layer therebetween, and a third region in the second region defining a second electrode. An erasing circuit selectively erases the single poly layer memory cell by supplying a first voltage reference of a first polarity to the spaced apart source and drain regions, a second voltage reference of a second polarity to the first region, and a third voltage reference of the second polarity to the second electrode of the capacitor. The first and second voltage references bias the first MOS transistor so that the third voltage reference for erasing the single poly layer memory cell does not cause a junction breakdown of the first MOS transistor.
Patrick J. Kelley - Orlando FL Chung Wai Leung - Orlando FL Ranbir Singh - Orlando FL
Assignee:
Agere Systems Guardian Corp. - Orlando FL
International Classification:
H01L 29788
US Classification:
257316
Abstract:
A split gate memory cell is described which is fabricated from two-polysilicon layers and comprises a silicon substrate having a source and a drain electrode and a storage node, a tunnel oxide on the substrate, a first control gate electrode and a floating gate electrode spaced from each other and fabricated from the same polysilicon layer and a second control gate electrode of a second poly material formed between and over the first control gate and floating gate and isolated therefrom by a dielectric layer therebetween.
Single-Poly Non-Volatile Memory Cell Having Low-Capacitance Erase Gate
Patrick J. Kelley - Orlando FL Ross A. Kohler - Allentown PA Chung W. Leung - Orlando FL Richard J. McPartland - Nazareth PA Ranbir Singh - Orlando FL
Assignee:
Lucent Technologies, Inc. - Murray Hill NJ
International Classification:
G11C 1604
US Classification:
36518529
Abstract:
A single-poly flash memory cell has a control device, a switch device, and an erase device, all of which share a common polysilicon floating gate which is designed to retain charge in the programmed memory cell. The memory cell is erased by applying an erase voltage to the tub of the erase device to cause tunneling across the oxide layer separating the floating gate from the rest of the erase device structure. Since a typical tub-to-source/drain breakdown voltage (e. g. , 15 volts) is greater than a typical erase voltage (e. g. , 10 volts), the memory cell can be safely erased without risking the junction breakdowns that are associated with other prior art single-poly memory cell designs for deep sub-micron technologies (e. g. , 0. 25-micron and lower).
Shallow Trench Isolation Method Providing Rounded Top Trench Corners
Patrick J. Kelley - Orlando FL Ranbir Singh - Orlando FL Larry B. Fritzinger - Orlando FL Cynthia C. Lee - Orlando FL John Simon Molloy - Orlando FL
Assignee:
Lucent Technologies, Inc. - Murray Hill NJ
International Classification:
H01L 2176
US Classification:
438425
Abstract:
A method of shallow trench isolation by forming a trench in a semiconductor device comprises the steps of forming an oxide layer; forming a mask layer; anisotropically etching the mask layer; forming a second oxide layer; forming a cap layer; forming rounded end caps adjacent the mask; and transferring the rounding of the caps to the top corners of the trench. The oxide layer is formed over a substrate of the semiconductor device. The mask layer is formed over the oxide layer. The mask layer is then anisotropically etched to form the mask and an opening in the mask. The opening in the mask exposes the substrate, and the width of the opening is greater than the width of the trench. Blanket etching the cap layer forms the rounded end caps. The rounded end caps are adjacent to the mask on opposite ends of the opening, and the distance between the end caps is about equal to the width of the trench. The trench is formed by plasma etching the trench.
Patrick J. Kelley - Orlando FL Chung Wai Leung - Orlando FL Ranbir Singh - Orlando FL
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
H01L 218247
US Classification:
438266
Abstract:
A method of fabricating a novel split gate memory cell comprises forming a tunnel oxide layer on a silicon substrate, forming a first conductive layer over said tunnel oxide layer, etching a trench in said conductive layer to divide said conductive layer into two separate layers with a space therebetween, one such layer to become a first gate electrode and the other separate layer to become a floating gate electrode of the device, forming a dielectric layer over the exposed surfaces, and depositing a second conductive layer which will become a second control gate electrode over said dielectric layer.
2008 to 2000 Physical Education Gym SupervisorAltech Services, Inc
2005 to 2006 Communications Specialist IUtiliquest, Inc
2004 to 2005 SupervisorBig Sky Locators, Inc
2001 to 2004 Locate Technician
Education:
Colorado State University 2013 B.S. of PsychologyColorado State University 2013 B.A. of Philosophy in Science and TechnologyAims Community College 2011 A.A. of Liberal Arts
Dec 2012 to 2000 OutfitterState of Illinois DHS Home Services Springfield, IL Oct 2011 to Jun 2012 Personal AssistantComcast Rolling Meadows, IL Jan 2007 to Feb 2010 Sales Support and AnalysisComcast Mount Prospect, IL Jun 2003 to Dec 2006 MDU Coordinator
Education:
Illinois State University 1985 to 1989 Bachelor's in Economics
Skills:
Microsoft Office Suite (Word, Excel, Access, Outlook, PowerPoint), browser expertise (Internet Explorer, Chrome, Safari, Firefox), Social Media, excellent written and verbal communication, working knowledge of Windows systems and servers, detail and organizational minded.
Bartlett, IL Logan Square, Chicago, IL Bucktown, Chicago, IL Lincoln Square, Chicago, IL Streamwood, IL River Falls, WI Normal, IL Schaumburg, IL Hoffman Estates, IL
Work:
Cabela's - Outfitter (2012) Comcast (2003-2010)
Education:
Illinois State University, University of Wisconsin-River Falls
Patrick Kelley
Work:
Warrior Transition Battalion - Company Commander (2011) Ireland Army Community Hospital - Operations (2011-2011) ALU - Student (2010-2011) 3d Ranger BN - MEDO (2008-2010) 82d ABN DIV - MEDO (2006-2008) OBC - Student (2005-2006) Cadet Command - Cadre (2005-2005) Illinois National Guard - Team Leader (2004-2005)
Education:
Illinois State University - Graphic Communications, University High School - Nothing, Pemberton High School - Nothing
Patrick Kelley
Work:
National Testing and Consulting, LLC - President (1)
Education:
Colorado School of Mines - Chemical Engineering and Petroleum Refining, Colorado School of Mines - Metallurgical and Materials Engineering
Tagline:
Riding the Earth.
Patrick Kelley
Education:
James Buchanan High School, South Hagerstown High School
About:
I do things for a time. Then, I move on to other things. There are a lot of things out there to do.