An integrated circuit chip package according to the present invention includes an integrated circuit chip mounted on a substrate by a plurality of solder bumps. A mold compound is used for underfilling air gaps between the chip and the substrate. The integrated circuit chip package is formed by placing the chip and substrate within a mold cavity and pressing a transfer mold compound into the mold cavity. Air spaces between the integrated circuit chip and the substrate are underfilled by the mold compound as it is pressed in between the integrated circuit chip and the substrate. Air is allowed to escape from between the chip and the substrate during the underfilling through a vent which extends through the substrate. The underfilling material may also be used to encapsulate the chip at the same time that underfilling is performed.
An integrated circuit chip package according to the present invention includes an integrated circuit chip that is mounted on a substrate by a reflow process and by a plurality of solder bumps. At least one standoff is located between the circuit chip and the substrate to maintain a distance between the circuit chip and the substrate during the reflow process. A mold compound is used for underfilling air gaps between the chip and the substrate. The integrated circuit chip package is formed by placing the chip and substrate within a mold cavity and pressing a transfer mold compound into the mold cavity. Air spaces between the integrated circuit chip and the substrate are underfilled by the mold compound as it is pressed in between the integrated circuit chip, the standoffs and the substrate. Air is allowed to escape from between the chip and the substrate during the underfilling through a vent which extends through the substrate. The underfilling material may also be used to encapsulate the chip at the same time that underfilling is performed.
Integrated Circuit Package Including Opening Exposing Portion Of An Ic
Matthew M. Salatino - Satellite Beach FL Patrick O. Weber - Mountain View CA
Assignee:
Authentec, Inc. - Melbourne FL Hestia Technologies, Inc. - Santa Clara CA
International Classification:
H01L 2300
US Classification:
174 521, 361728, 361752, 257690, 257787
Abstract:
An IC package preferably includes an IC and encapsulating material surrounding the IC, with the encapsulating material having an opening therein to define an exposed portion of the IC. Vestigial portions of encapsulating material may be left on the exposed portion of the IC and spaced inwardly from a periphery of the opening based upon molding using a mold protrusion which includes a bleed-through retention channel positioned inwardly from peripheral edges. The channel collects and retains any bleed-through of the encapsulating material. The IC package may further include a leadframe carrying the IC. The leadframe may include a die pad, finger portions, and a plurality of die pad support bars. The die pad may be downset below a level of the finger portions. Each of the die pad support bars may be resiliently deformed to accommodate the downset of the die pad.
Methods And Apparatus For Making Integrated Circuit Package Including Opening Exposing Portion Of The Ic
A method for making an IC package preferably includes providing a mold including first and second mold portions, and wherein the first mold portion carries a mold protrusion defining an IC-contact surface with peripheral edges and a bleed-through retention channel positioned inwardly from the peripheral edges. The method also preferably includes closing the first and second mold portions around the IC and injecting encapsulating material into the mold to encapsulate the IC and make the IC package having an exposed portion of the IC adjacent the mold protrusion. Morever, the bleed-through retention channel retains any encapsulating material bleeding beneath the peripheral edges of the IC contact surface, and prevents the encapsulating material from reaching further onto the exposed portion of the IC. The method may also include releasing the IC package with the exposed portion from the mold.
Light-Emitting Pixel Array Package And Method Of Manufacturing The Same
A method of manufacturing a display monitor, the method comprising: molding a pixel array frame having a plurality of pixel cavities and at least one pixel wall positioned adjacent to at least two pixel cavities, at least one of the pixel cavities having a light pit therein; molding a light diffusing material in the pixel cavities, wherein the light diffusing material does not enter the light pit; selecting a substrate having a top surface and a bottom surface, the substrate having a light source, such as a LED, on the top surface; coupling the bottom surface of the substrate to a printed circuit board configured to controllably operate the light source, wherein the light source is received within the light pit; and coupling the molded pixel array frame to the substrate.
Thermal Management Method And Device For Solar Concentrator Systems
Patrick Weber - Santa Clara CA, US Kevin Gibson - Redwood City CA, US Ramon Rosal Reglos - San Ramon CA, US Rick Briere - Santa Clara CA, US Alelie Funcell - Fremont CA, US
Assignee:
Solaria Corporation - Fremont CA
International Classification:
H01L 31/052
US Classification:
136246
Abstract:
A photovoltaic device. The photovoltaic device includes a photovoltaic region including a surface region and characterized by a first thermal expansion constant. The surface region includes a first portion and a second portion, the second portion includes a first edge region and a second edge region. The photovoltaic device includes a concentrator element comprising substantially of a polymer material and being characterized by a second thermal expansion constant. The concentrator element includes an aperture region and an exit region. The photovoltaic device includes an elastomer material to couple the first portion of the surface region of the photovoltaic region to the exit region of the concentrator element, while the first edge region and the second edge region remain exposed. The first edge region and the second edge region allow for compensation by at least thermal expansion of the concentrator element for a change in temperature ranging from about −45 Degrees Celsius to about 95 Degrees Celsius to maintain the exit region to be optically coupled to the photovoltaic region.
Allan CANTLE - Westlake Village CA, US Patrick WEBER - Oxnard CA, US Mark GILLIAM - Thousand Oaks CA, US Prashant JOSHI - Thousand Oaks CA, US
International Classification:
G11C 5/06
US Classification:
365 63
Abstract:
Solid state memory modules are disclosed having increased density for module size/footprint. Different embodiments also provide for improved interconnect arrangements between the memory modules and the corresponding field programmable gate array (FPGA), micro-processor (μP), or application-specific integrated circuit (ASIC). These interconnects can provide for greater module interconnect flexibility, operating speed and operating efficiency. Some memory module embodiments according to the present invention comprises a plurality of solid state memory devices arranged on a first printed circuit board. A second printed circuit board is on and electrically connected to the first printed circuit board, with the second printed circuit board having a pin-out for direct coupling to a host device.
An integrated circuit chip package according to the present invention includes an integrated circuit chip mounted on a substrate by a plurality of solder bumps. A mold compound is used for underfilling air gaps between the chip and the substrate. The integrated circuit chip package is formed by placing the chip and substrate within a mold cavity and pressing a transfer mold compound into the mold cavity. Air spaces between the integrated circuit chip and the substrate are underfilled by the mold compound as it is pressed in between the integrated circuit chip and the substrate. Air is allowed to escape from between the chip and the substrate during the underfilling through a vent which extends through the substrate. The underfilling material may also be used to encapsulate the chip at the same time that underfilling is performed.