Philip Lb Scott

US Patent:

20100282276, Nov 11, 2010

Filed:

Jul 23, 2010

Appl. No.:

12/842865

Inventors:

Timothy Kueper - Cupertino CA, US
Joseph Laia - Santa Clara CA, US
Jason Corneille - San Jose CA, US
Philip Scott - Santa Clara CA, US

Assignee:

MIASOLE - Santa Clara CA

International Classification:

B24B 1/00
B24B 55/12
B24B 7/06
B08B 7/00
H01L 31/18

US Classification:

134 6, 451 57, 451 53, 451184, 438 95, 438 96, 257E31047, 257E31015

Abstract:

Provided are methods and apparatuses for processing photovoltaic cell metallic substrates to remove various surface defects. In certain embodiments, a thin stainless steel foil is polished using a proposed method leading to a substantial, e.g., twice or more, increase in its surface gloss. In certain embodiments, a method in accordance with the present invention involves contacting a substrate surface with a fixed-abrasive filament roller brush. The brush may be a close-wound coil brush. The brush includes filaments carrying 5-20 micrometer abrasive particles that are permanently fixed in the brush filaments, for example a polymer base material, such as nylon. The particles may be made of silicon carbide and/or other abrasive materials. In certain embodiments, a substrate surface is polished using a series of roller brushes, at least two of which rotate in different directions with respect to that surface.

US Patent:

20120262181, Oct 18, 2012

Filed:

Apr 13, 2011

Appl. No.:

13/085838

Inventors:

Philip A. Scott - San Jose CA, US

Assignee:

MiaSole - Santa Clara CA

International Classification:

G01N 27/60

US Classification:

324452

Abstract:

A method for testing a conductive web includes moving a conductive web past at least one electrostatic probe, providing an alternating current or voltage which generates an alternating current to the at least one electrostatic probe, measuring a current or voltage in the at least one electrostatic probe induced by a capacitance between the conductive web and the at least one electrostatic probe, comparing the measured current or voltage to a reference value, and determining a level of bagginess of the conductive web based on the step of comparing.