Quynh T Nguyen

US Patent:

20230099805, Mar 30, 2023

Filed:

Jan 7, 2022

Appl. No.:

17/571271

Inventors:

- Jiangsu, CN
Dexian Liu - Jiangsu, CN
Quynh Ngoc Nguyen - Fremont CA, US
Qihai Liang - Jiangsu, CN

International Classification:

G01R 31/28

Abstract:

A test socket for an IC chip includes a retainer positioned adjacent a load board, the retainer defining a plurality of apertures corresponding to contact pads on the load board; a plurality of contacts disposed in the plurality of apertures, the plurality of contacts configured to electrically couple the IC chip to the contact pads; a housing defining a chamber in fluid communication with an inlet, a liquid outlet, and a vapor outlet. The housing includes a body structure defining a plurality of cavities corresponding to the plurality of apertures and configured to receive the plurality of contacts therein, and a guide structure configured to receive the IC chip and position the IC chip in the chamber when engaged with the plurality of contacts. The chamber receives a two phase fluid coolant via the inlet to at least partially submerges the plurality of contacts in the two phase fluid coolant.

Address:

2492 Boren Dr, San Jose, CA 95121

Phone:

4087044000

VIN:

JTDKN3DU3C1580187

Make:

TOYOTA

Model:

PRIUS

Year:

2012

Address:

4011 Forestbrook Way, San Jose, CA 95111

Phone:

4088478688

VIN:

2HNYD2H45BH536185

Make:

ACURA

Model:

MDX

Year:

2011