Citi - New York since Jun 2012
Business Performance Analyst
Citi - New York, NY Mar 2010 - May 2012
Re-engineering - Project Manager
Citi - New York, NY Jul 2008 - Feb 2010
Financial Management Associate
HDFC Bank - New Delhi, India Mar 2005 - Aug 2006
Credit Manager - Retail Assets
HSBC - Noida, India Dec 2002 - Mar 2005
Cards Officer, Credit Card Division
Education:
University of Rochester - William E. Simon Graduate School of Business Administration 2006 - 2008
Master of Business Administration (MBA), Finance
Delhi University 1999 - 2002
Bachelor of Business Administration (BBA), Marketing
- Austin TX, US Vishnu K. Khemka - Chandler AZ, US Raghu Gupta - Austin TX, US Moaniss Zitouni - Gilbert AZ, US Ganming Qin - Chandler AZ, US
International Classification:
H01L 29/78 H01L 29/08 H01L 29/66
Abstract:
A field effect device includes a semiconductor body separating a source and a drain, both source and drain coupled to the semiconductor body. An insulated control gate is located over the semiconductor body between the source and drain and configured to control a conductive channel extending between the source and drain. First and second doped regions such as highly-doped regions are adjacent to the source. The first or second doped region may be a cathode short region electrically coupled to the source. The cathode short region may be used in a bidirectional power MOSFET.
Bidirectional Power Mosfet Structure With A Cathode Short Structure
- Austin TX, US Vishnu K. Khemka - Chandler AZ, US Raghu Gupta - Austin TX, US Moaniss Zitouni - Gilbert AZ, US Ganming Qin - Chandler AZ, US
International Classification:
H01L 29/78 H01L 29/66
Abstract:
A field effect device includes a semiconductor body separating a source and a drain, both source and drain coupled to the semiconductor body. An insulated control gate is located over the semiconductor body between the source and drain and configured to control a conductive channel extending between the source and drain. First and second doped regions such as highly-doped regions are adjacent to the source. The first or second doped region may be a cathode short region electrically coupled to the source. The cathode short region may be used in a bidirectional power MOSFET.
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