Randall B Stimson

US Patent:

7253607, Aug 7, 2007

Filed:

Jul 29, 2005

Appl. No.:

11/192927

Inventors:

Stephen J. Hlotyak - Belmont MA, US
Randall B. Stimson - Boston MA, US
Daniel P. Thornton - Medfield MA, US

Assignee:

Teradyne, Inc. - North Reading MA

International Classification:

G01R 31/28

US Classification:

3241581

Abstract:

A method for use with automatic test equipment (ATE) having sites, each which accommodates a device under test (DUT), includes defining an object for use with the plural sites, where the object is to contain data associated with at least some of the plural sites, and where the object determines which sites are active. The method also includes using the object during testing of DUTs by the ATE.

US Patent:

7487422, Feb 3, 2009

Filed:

Jul 19, 2005

Appl. No.:

11/184579

Inventors:

Randall B. Stimson - Boston MA, US

Assignee:

Teradyne, Inc. - North Reading MA

International Classification:

G01R 31/28
G06F 11/00

US Classification:

714741, 717136

Abstract:

A device is tested using a system that includes automatic test equipment (ATE) and a computer. At the ATE, the testing includes receiving data from the device, and processing the data to obtain processed data. At the computer, the testing includes executing a computer program while the data is being processed at the ATE, where the computer program processes an object that contains a pointer, passing the object to the ATE, and receiving the object from the ATE. The pointer in the object is replaced with the processed data.

US Patent:

20040215361, Oct 28, 2004

Filed:

Jun 12, 2003

Appl. No.:

10/460104

Inventors:

Stephen Hlotyak - Belmont MA, US
Alan Blitz - Newton MA, US
Randall Stimson - Boston MA, US

International Classification:

G06F019/00
H04L001/22
G06F009/44

US Classification:

700/121000, 714/038000, 717/124000

Abstract:

An automatic test system, such as might be used to test semiconductor devices as part of their manufacture. The test system uses instruments to generate and measure test signals. The automatic test system has a hardware and software architecture that allows instruments to be added to the test system after it is manufactured. The software is segregated into instrument specific and instrument independent software. Predefined interfaces to the software components allow for easy integration of instruments into the test system and also easy reuse of the software as the physical implementation of the test system or the instruments changes from tester to tester in a product family.

US Patent:

20130102091, Apr 25, 2013

Filed:

Oct 25, 2011

Appl. No.:

13/281148

Inventors:

Jason D. King - Derry NH, US
Richard Pye - Burlington MA, US
Randall B. Stimson - Fort Lauderdale FL, US
Steven R. Shirk - Encino CA, US

Assignee:

Teradyne, Inc. - North Reading MA

International Classification:

H01L 21/66
G06F 19/00
G01R 31/20

US Classification:

438 5, 32475024, 702119, 257E21529

Abstract:

Techniques for configuring a test system that enable simple specification of a degree of concurrency in testing separate functional portions of a semiconductor device. For a test flow with multiple sub-flows; the pins accessed in connection with each sub-flow may define a flow domain. Site regions, each associated with a flow domain, may be defined. Tester sites may be associated with each of these flow domain specific site regions and independently operating resources may be assigned to these tester sites. A second portion of the defined site regions may be associated with tester sites, but resources assigned to these site regions may be accessed from multiple flow domains. Test blocks, even if not developed for concurrent execution, may be executed concurrently using resources in the flow domain specific site regions. Flexibility is provided to share resources through the use of the second portion of the site regions.