Randy W Alkire

US Patent:

7162888, Jan 16, 2007

Filed:

Mar 24, 2004

Appl. No.:

10/807599

Inventors:

Deming Shu - Darien IL, US
Andrzej Joachimiak - Bolingbrook IL, US
Curt A. Preissner - Rosemont IL, US
Daniel Nocher - Elwood IL, US
Yufeng Han - Chicago IL, US
Juan Barraza, Jr. - Los Alamos NM, US
Peter Lee - Wheaton IL, US
Zhonghou Cai - Naperville IL, US
Stephan Ginell - Naperville IL, US
Randy Alkire - Romeoville IL, US
Robert G. Schuessler - Downers Grove IL, US

Assignee:

UChicago Argonne LLC - Chicago IL

International Classification:

F25D 25/00
F25B 19/00
H05G 1/00

US Classification:

62378, 62 62, 62 511, 378208

Abstract:

A method and robot-based automation system are provided for cryogenic crystal sample mounting, for example, for use for cryogenic crystal sample mounting in the x-ray crystallography station at an x-ray source. The system includes a robot arm carrying a handset. The handset includes a pair of elongated fingers for sample mounting, and each finger carrying a set of strain gauge arrays for providing force sensing. A slim finger design allows a sample mounting process with no interference with the beam stop, cryostreem and x-ray detectors. The handset can detect the contact force intensity and direction; provide a precise gripping action; and feel the results of the gripping. The finger design incorporates a mechanism to maintain the sample temperature well below the cryogenic safety margin for the crystal viability. A Dewar container is provided with an ice control system and liquid nitrogen flow control. A triangular sample magazine maximizes the Dewar space usage.

US Patent:

20090027057, Jan 29, 2009

Filed:

Jul 26, 2007

Appl. No.:

11/828941

Inventors:

John T. Anderson - Elburn IL, US
Patrick DeLurgio - Darien IL, US
Randy Alkire - Romeoville IL, US
Michael Molitsky - Plainfield IL, US

International Classification:

G01R 29/12

US Classification:

324457

Abstract:

An electrometer includes an input terminal adapted to receive an input signal an ethernet terminal, a web server, and a microcontroller. The ethernet terminal is adapted to receive an ethernet cable such that electrical power is provided to the ethernet terminal. The web server is in electrical communication with the ethernet terminal, and is adapted to receive a command. The microcontroller is in electrical communication with at least one of the ethernet terminal and the web server, and is adapted to execute the received command.

US Patent:

6596994, Jul 22, 2003

Filed:

Sep 21, 2000

Appl. No.:

09/665958

Inventors:

Randy W. Alkire - Naperville IL
Gerold Rosenbaum - Homer Township IL
Gwyndaf Evans - Cambridge, GB

Assignee:

The United States of America as represented by the United States Department of Energy - Washington DC

International Classification:

G01T 129

US Classification:

2503361, 378205

Abstract:

An apparatus for determining the position of an x-ray beam relative to a desired beam axis. Where the apparatus is positioned along the beam path so that a thin metal foil target intersects the x-ray beam generating fluorescent radiation. A PIN diode array is positioned so that a portion of the fluorescent radiation is intercepted by the array resulting in an a series of electrical signals from the PIN diodes making up the array. The signals are then analyzed and the position of the x-ray beam is determined relative to the desired beam path.

US Patent:

20190057888, Feb 21, 2019

Filed:

Aug 18, 2017

Appl. No.:

15/680954

Inventors:

- Chicago IL, US
Randy Alkire - Romeoville IL, US

Assignee:

UCHICAGO ARGONNE, LLC - Chicago IL

International Classification:

H01L 21/67
H01L 31/0336
H01J 37/30
H01L 31/16
H01J 37/317
G03F 7/20
G01J 1/02
H01L 31/02

Abstract:

The invention provides a beam intensity/positioning monitor substrate comprising a first metal foil in physical contact with a second metal foil. Also provided is a method for determining mass absorption coefficients, the method comprising measuring the absorption of an incident radiation beam by a first metal and a second metal comprising a bi-metal foil as a function of a first energy and a second energy; calculating the relative first metal thickness; using the relative thickness as a target value for the first metal fitting procedure; repeat the above steps on a free standing first metal foil; using the free standing first metal absorption measurements, bulk first metal density and first (bimetal) fit coefficients to determine first metal foil thickness; using free standing first metal to conduct a high resolution scan from just below its absorption edge to 1 keV or higher in energy; and using the free standing first metal absorption measurements below the absorption edge and experimentally determined thickness to compute mass absorption coefficients below its absorption edge.