Mark R. Bilak - Burlington VT, US Joseph M. Forbes - Westford VT, US Curt Guenther - Essex Junction VT, US Michael J. Maloney - Waterbury Center VT, US Michael D. Maurice - Jericho VT, US Timothy J. O'Gorman - Williston VT, US Regis D. Parent - Underhill VT, US Jeffrey S. Zimmerman - Hinesburg VT, US
Assignee:
International Business Machines Corporation - Armonk NY
A method for creating a guardband that incorporates statistical models for test environment, system environment, tester-to-system offset and reliability into a model and then processes a final guardband by factoring manufacturing process variation and quality against yield loss.