Real Estate Design and Re Modeling Real Estate Investment Partners In today's economy I do not have to tell you how hard it is in Real Estate but there still are good opportunities to make money. Surely not as much as people were making a few years ago but far more then banks are paying in interest.
So if you buy in the right developements with high sales rates and put that money that is sitting on the side lines in a bank you can make some handsome profits and returns on that money far better than you could in the market and for sure much much better then in a bank !!
The trick is to find an honest partner who haoppens to be a General Contractor as well. I can use the extra funds and you have use of my exoertise and building material connections not to mention laborerers and trades people.
We all share a piece of the pie which is backed by real estate and has the potential to earn equity as well as profits.
A win win situation in todays world for sure.
There is POWER in numbers and PROFITS too !!
About:
I am originally from New York City. I was born, raised and educated there. I am of Italian Decent and come from a good Italian Family. Raised by decent and honest Italian Parents. A Family of business and trades people.
I learned at an early age many trades and have been practicing them for many years.
Now at 62 years of age I am for the most part a superviser for my guys who are very good at what they do.
If you want the right job at the right price I am your man.
If you are looking for cheap sabby work then please Do NOT contact me.
I am fair and I am honest to a fault .
Dr. Conti works in Boothwyn, PA and 3 other locations and specializes in Podiatric Medicine. Dr. Conti is affiliated with Christiana Hospital, Crozer Chester Medical Center, Jennersville Regional Hospital and Penn Medicine Chester County Hospital.
Us Patents
Method For Low Temperature Chemical Vapor Deposition Of Low-K Films Using Selected Cyclosiloxane And Ozone Gases For Semiconductor Applications
A method is described for forming a low-k dielectric film, in particular, a pre-metal dielectric (PMD) on a semiconductor wafer which has good gap-filling characteristics. The method uses a thermal sub-atmospheric CVD process that includes a carbon-containing organometallic precusor such as TMCTS or OMCTS, an ozone-containing gas, and a source of dopants for gettering alkali elements and for lowering the reflow temperature of the dielectric while attaining the desired low-k and gap-filling properties of the dielectric film. Phosphorous is a preferred dopant for gettering alkali elements such as sodium. Additional dopants for lowering the reflow temperature include, but are not limited to boron, germanium, arsenic, fluorine or combinations thereof.
Carbon-Graded Layer For Improved Adhesion Of Low-K Dielectrics To Silicon Substrates
Richard A. Conti - Mount Kisco NY Prakash Chimanlal Dev - Plano TX David M. Dobuzinsky - New Windsor NY Daniel C. Edelstein - White Plains NY Gill Y. Lee - Wappingers Falls NY Padraic C. Shafer - Beacon NY Alexander Simpson - Wappingers Falls NY Peter Wrschka - Wappingers Falls NY
Assignee:
International Business Machines Corporation - Armonk NY
A structure and method for an insulator layer having carbon-graded layers above a substrate is disclosed, wherein the concentration of carbon increases in each successive carbon-graded layer above the substrate. The insulator comprises a low-k dielectric having a dielectric constant less than 3. 3. The carbon-graded layer increases adhesion between the substrate and the insulator and between the insulator and the conductor layer. The structure may also include stabilization interfaces between the carbon-graded layers. More specifically, the carbon-graded layers include a first layer adjacent the substrate having a carbon content between about 5% and 20%, a second layer above the first layer having a carbon content between about 10% and 30%, and a third layer above the second layer having a carbon content between about 20% and 40%.
Carbon-Graded Layer For Improved Adhesion Of Low-K Dielectrics To Silicon Substrates
Richard A. Conti - Mount Kisco NY Prakash Chimanlal Dev - Plano TX David M. Dobuzinsky - New Windsor NY Daniel C. Edelstein - White Plains NY Gill Y. Lee - Wappingers Falls NY Padraic C. Shafer - Beacon NY Alexander Simpson - Wappingers Falls NY Peter Wrschka - Wappingers Falls NY
Assignee:
International Business Machines Corporation - Armonk NY Infineon Technologies A.G.
International Classification:
H01L 5140
US Classification:
438 99, 438624, 438780
Abstract:
A structure and method for an insulator layer having carbon-graded layers above a substrate is disclosed, wherein the concentration of carbon increases in each successive carbon-graded layer above the substrate. The insulator comprises a low-k dielectric having a dielectric constant less than 3. 3. The carbon-graded layer increases adhesion between the substrate and the insulator and between the insulator and the conductor layer. The structure may also include stabilization interfaces between the carbon-graded layers. More specifically, the carbon-graded layers include a first layer adjacent the substrate having a carbon content between about 5% and 20%, a second layer above the first layer having a carbon content between about 10% and 30%, and a third layer above the second layer having a carbon content between about 20% and 40%.
Stabilization Of Fluorine-Containing Dielectric Materials In A Metal Insulator Wiring Structure
Richard A. Conti - Katonah NY, US Kenneth Davis - Newburgh NY, US John A. Fitzsimmons - Poughkeepsie NY, US David L. Rath - Stormville NY, US Daewon Yang - Fishkill NY, US
Assignee:
International Business Machines Corporation - Armonk NY
A process for providing regions of substantially lower fluorine content in a fluorine-containing dielectric comprises exposing the fluorine-containing dielectric to a reactive species to form volatile byproducts.
Method For Low Temperature Chemical Vapor Deposition Of Low-K Films Using Selected Cyclosiloxane And Ozone Gases For Semiconductor Applications
Richard A. Conti - Katonah NY, US Daniel C. Edelstein - White Plains NY, US Gill Yong Lee - Wappingers Falls NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 21/469
US Classification:
438786, 438787, 438778, 438758
Abstract:
A method is described for forming a low-k dielectric film, in particular, a pre-metal dielectric (PMD) on a semiconductor wafer which has good gap-filling characteristics. The method uses a thermal sub-atmospheric CVD process that includes a carbon-containing organometallic precusor such as TMCTS or OMCTS, an ozone-containing gas, and a source of dopants for gettering alkali elements and for lowering the reflow temperature of the dielectric while attaining the desired low-k and gap-filling properties of the dielectric film. Phosphorous is a preferred dopant for gettering alkali elements such as sodium. Additional dopants for lowering the reflow temperature include, but are not limited to boron, germanium, arsenic, fluorine or combinations thereof.
Bilayer Cap Structure Including Hdp/Bhdp Films For Conductive Metallization And Method Of Making Same
Richard A. Conti - Katonah NY, US Thomas F. Houghton - Marlboro NY, US Michael F. Lofaro - Hopewell Junction NY, US Jeffery B. Maxson - New Windsor NY, US Ann H. McDonald - New Windsor NY, US Yun-Yu Wang - Poughquag NY, US Keith Kwong Hon Wong - Wappingers Falls NY, US Daewon Yang - Hopewell Junction NY, US
Assignee:
International Buisness Machines Corporation - Armonk NY
International Classification:
H01L 21/31 H01L 21/469
US Classification:
438788, 438792
Abstract:
The present invention relates to a bilayer cap structure for interconnect structures that comprise copper metallization or other conductive metallization. Such bilayer cap structure includes a first cap layer formed by an unbiased high density plasma (HDP) chemical vapor deposition process, and a second cap layer over the first cap layer, where the second cap layer is formed by a biased high density plasma (bHDP) chemical vapor deposition process. During the bHDP chemical vapor deposition process, a low AC bias power is applied to the substrate to increase the ion bombardment on the substrate surface and to induce resputtering of the capping material, thereby forming a seamless second cap layer with excellent reactive ion etching (RIE) selectivity.
Method Of Forming Nitride Films With High Compressive Stress For Improved Pfet Device Performance
Richard A. Conti - Katonah NY, US Ronald P. Bourque - Wappingers Falls NY, US Nancy R. Klymko - Hopewell Junction NY, US Anita Madan - Danbury CT, US Michael C. Smits - Poughkeepsie NY, US Roy H. Tilghman - Stormville NY, US Kwong Hon Wong - Wappingers Falls NY, US Daewon Yang - Hopewell Junction NY, US
Assignee:
International Business Machines Corporation - Armonk NY Novellus Systems, Inc. - San Jose CA
International Classification:
H01L 21/8238
US Classification:
438199, 438792
Abstract:
A method is provided for making a FET device in which a nitride layer overlies the PFET gate structure, where the nitride layer has a compressive stress with a magnitude greater than about 2. 8 GPa. This compressive stress permits improved device performance in the PFET. The nitride layer is deposited using a high-density plasma (HDP) process, wherein the substrate is disposed on an electrode to which a bias power in the range of about 50 W to about 500 W is supplied. The bias power is characterized as high-frequency power (supplied by an RF generator at 13. 56 MHz). The FET device may also include NFET gate structures. A blocking layer is deposited over the NFET gate structures so that the nitride layer overlies the blocking layer; after the blocking layer is removed, the nitride layer is not in contact with the NFET gate structures. The nitride layer has a thickness in the range of about 300-2000 â„«.
Process Of Making A Semiconductor Device Using Multiple Antireflective Materials
Marie Angelopoulos - Cortlandt Manor NY, US Katherina E. Babich - Chappaqua NY, US Sean D. Burns - Hopewell Junction NY, US Richard A. Conti - Katonah NY, US Allen H. Gabor - Katonah NY, US Scott D. Halle - Hopewell Junction NY, US Arpan P. Mahorowala - Bronxville NY, US Dirk Pfeiffer - Dobbs Ferry NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 21/4763
US Classification:
438636, 438 72, 257E21029, 430311
Abstract:
A lithographic structure consisting essentially of: an organic antireflective material disposed on a substrate; a vapor-deposited RCHX material, wherein R is one or more elements selected from the group consisting of Si, Ge, B, Sn, Fe and Ti, and wherein X is not present or is one or more elements selected from the group consisting of O, N, S and F; and a photoresist material disposed on the RCHX material. The invention is also directed to methods of making the lithographic structure, and using the structure to pattern a substrate.
Name / Title
Company / Classification
Phones & Addresses
Richard L. Conti Principal
Richs Hobby Depot Ret Hobbies/Toys/Games
68 Chaffee Ave, Albertson, NY 11507
Richard Conti Principal
South Shores Bar & Grill Eating Place
502 Lucerne Ave, Lake Worth, FL 33460 5615477656
Richard N Conti Manager
RACER POWERBOATS LLC Ret Boats
2811 NE 7 St, Pompano Beach, FL 33062 2811 NE 7, Pompano Beach, FL 33062 9542347223
Richard Conti
SYDNEY CANDLE COMPANY, LLC
Richard A Conti
WESTERSUN, LLC
Richard Conti Director
Durham "F" Condominium Association. Inc
246 Durham F, Pompano Beach, FL 33442 2400 Centrepark W Dr, West Palm Beach, FL 33409 3501 E West Dr, Pompano Beach, FL 33442 306 Durham I, Pompano Beach, FL 33442
Richard Conti CEO
E K SUCCESS LTD, INC
2240 W 75 St, Woodridge, IL 60517 261 Riv Rd, Clifton, NJ 07014 124 W Capitol Ave STE 1900, Little Rock, AR 72201 300 Spg BUILDING , SUITE 900 300 S SPRING STREET, Little Rock, AR 72201
Mary Jones, Diane Borges, Jimmy Bermudez, Jennifer Blouin, J Brown, Kevin M, Jennifer Souza, Christine Pullen, Michael Escobar, Adilia Dasilva, Crystal Fortier
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