Richard S Wittman

US Patent:

20210349040, Nov 11, 2021

Filed:

May 17, 2021

Appl. No.:

17/322635

Inventors:

- Richland WA, US
Richard E. Jacob - Kennewick WA, US
Nikhil S. Deshmukh - Everett WA, US
Cynthia L. Warner - Richland WA, US
Richard S. Wittman - Richland WA, US
Luke W. Campbell - Richland WA, US
Dustin M. Kasparek - Richland WA, US
Andy Gilbert - Richland WA, US
Kurt L. Silvers - Pasco WA, US
Mital A. Zalavadia - Richland WA, US

Assignee:

Battelle Memorial Institute - Richland WA

International Classification:

G01N 23/041
G01N 23/083
G01N 23/10
A61B 6/00
A61B 6/06

Abstract:

Method include emitting x-rays from an x-ray source, directing a first portion of the x-rays through an object grating situated adjacent to an object while the object is scanned relative to the object grating along a scan direction, directing a second portion of the x-rays through the object and subsequently through a detector grating without transmitting through the object grating, wherein the object grating and detector grating are adjacently arranged in a field of view of the x-rays sequentially with respect to each other in the scan direction, and receiving the first portion transmitted through the object and object grating with a first portion of a detector and receiving the second portion transmitted through the object and the detector grating with a second portion of the detector adjacent to the first portion of the detector. Systems are also disclosed, along with related techniques for beam hardening correction.

US Patent:

20200305812, Oct 1, 2020

Filed:

Mar 25, 2019

Appl. No.:

16/363989

Inventors:

- Richland WA, US
Richard E. Jacob - Kennewick WA, US
Nikhil S. Deshmukh - Everett WA, US
Cynthia L. Warner - Richland WA, US
Richard S. Wittman - Richland WA, US
Luke W. Campbell - Richland WA, US

Assignee:

BATTELLE MEMORIAL INSTITUTE - Richland WA

International Classification:

A61B 6/00

Abstract:

Systems and methods that directly image attenuation-based object grid, use a source grid to improve imaging of the object grid using a high-energy polychromatic source, and use a detector grid having gratings oriented substantially orthogonally to that of the object grid, can address artifacts and beam hardening effects that limit the quality and discriminatory power of high-energy x-ray imaging that includes phase contrast.

US Patent:

20140226773, Aug 14, 2014

Filed:

Feb 13, 2013

Appl. No.:

13/766600

Inventors:

- Richland WA, US
- Pullman WA, US
Richard S. Wittman - Richland WA, US
Bruce D. Pierson - Kennewick WA, US
Lawrence R. Greenwood - Richland WA, US

Assignee:

WASHINGTON STATE UNIVERSITY - Pullman WA
BATTELLE MEMORIAL INSTITUTE - Richland WA

International Classification:

G21G 1/02

US Classification:

376159, 376158

Abstract:

Target assemblies are provided that can include a uranium-comprising annulus. The assemblies can include target material consisting essentially of non-uranium material within the volume of the annulus. Reactors are disclosed that can include one or more discrete zones configured to receive target material. At least one uranium-comprising annulus can be within one or more of the zones. Methods for producing isotopes within target material are also disclosed, with the methods including providing neutrons to target material within a uranium-comprising annulus. Methods for modifying materials within target material are disclosed as well as are methods for characterizing material within a target material.