Robert B Doherty

US Patent:

44481110, May 15, 1984

Filed:

Jan 2, 1981

Appl. No.:

6/222721

Inventors:

Robert P. Doherty - Hacienda Heights CA

International Classification:

F24F 1306

US Classification:

98 38E

Abstract:

A unit for heating or cooling multiple rooms including a plenum diffuser mounted parallel within a ceiling runner and supported by hangars within the ceiling plenum. Each unit includes a round inlet collar, an elongated plenum to form a "Venturi," hinged volume dampers, secondary air openings, a bottom plenum chamber, and a pattern controller. The volume dampers housed within the Venturi work in unison. When the volume dampers are open, the unit functions similar to any conventional heating or cooling plenum diffuser. Primary air (heating air or cooling air) will enter the unit and leave through a discharge opening with no change in the air quantity or temperature. As space cooling or heating requirements are met, the volume dampers close at a preset distance, the primary air is reduced (variable volume), the velocity is increased and induces (induction) warm return air through the secondary air openings from the ceiling plenum, or ducted room return, into the primary air stream. This maintains effective room air motion and varies the air discharge temperature (variable discharge temperature) to bring the space to the desired temperature quicker. A pattern controller is located at the discharge opening of the unit, which when rotated, will adjust the air system to numerous air patterns.

US Patent:

63307448, Dec 18, 2001

Filed:

Jul 12, 1999

Appl. No.:

9/351423

Inventors:

Robert C. Doherty - Foothill Ranch CA
Thomas K. Stewart - Fountain Valley CA

Assignee:

PJC Technologies, Inc. - Lake Forest IL

International Classification:

H01R 4300

US Classification:

29825

Abstract:

An improved method of manufacturing an electrical probe test head is provided for testing electrical circuits, such as, e. g. , IC-chips and circuit boards. The test head can be employed in circuit testers, such as, e. g. , circuit board testers and probe cards, to provide an electrical connection between the terminals of the circuit to be tested and external test circuitry. The method of manufacturing the test head includes selecting an electrical circuit having terminals arranged in a terminal pattern. Vertical probe pitch series sets are provided, each of which includes a plurality of electrically conductive rigid pins, which is made of a suitable material, such as, e. g. , tungsten. Each of the rigid pins has a pin shaft and a pin contact tip. The pin contact tips are configured in a pin pattern corresponding to the terminal pattern, i. e.