Robert Cordell Erwin

US Patent:

6384771, May 7, 2002

Filed:

Apr 25, 2000

Appl. No.:

09/558275

Inventors:

Warren J. Montague - Redondo Beach CA
Garin S. Bircsak - North Hollywood CA
John K. Keigharn - Rancho Palos Verdes CA
Jorge L. Barboza - Buena Park CA
Robert W. Erwin - Redondo Beach CA

Assignee:

Raytheon Company - Lexington MA

International Classification:

G01S 740

US Classification:

342170, 342165, 342169, 342171, 342172, 342195

Abstract:

An automated simulator for radar and sonar applications. The inventive simulator is implemented in hardware and generates current parameters with respect to a simulated target in response to a plurality of initial values with respect thereto. In the illustrative embodiment, the initial values include range, velocity, and acceleration and are stored in first, second and third register respectively. In the best mode, the invention is implemented in a field-programmable gate array. The inventive target simulator also includes a range delay circuit for generating a simulated return from the simulated target. The range delay circuit includes logic for determining whether a simulated pulse train to be received is ambiguous or unambiguous and adjusting the pulse repetition rate of the pulse train accordingly. The range delay circuit calculates die initial time that a packet needs to make the trip to and from the target. Then, in the ambiguous case, the circuit only calculates how long it takes between pulses to arrive rather than the entire round trip.

US Patent:

41257715, Nov 14, 1978

Filed:

Nov 18, 1977

Appl. No.:

5/852799

Inventors:

Robert C. Erwin - Calabasas CA

Assignee:

NET Systems Inc. - Woodland Hills CA

International Classification:

G01N 2320
G21K 100

US Classification:

250277R

Abstract:

The present invention is an improvement for use in combination with an apparatus for determining stress and percent retained austenite in a specimen so the apparatus may be used to analyze both Nickel and Titanium alloyed materials. The apparatus includes a first X-ray source with either a copper or cobalt target which irradiates with an X-ray beam a surface area of the specimen impinging on the surface area at a particular angle and a second X-ray source with either a copper or cobalt target which irradiates with an X-ray beam the same surface area of the specimen simultaneously impinging at another particular angle. The apparatus also includes a first detector tube and a second detector tube, each of which has a combination filter of iron oxide and steel foil, for detecting diffracted X-rays in particular crystallographic planes. The apparatus further includes circuitry which is independently responsive to the output of the first and second detector tubes for providing outputs proportional to the intensities of the diffracted X-rays, positioning mechanism for positioning the first and second detector tubes in response to the difference of the outputs and angular detecting mechanism for detecting angular position of the first and second detector tubes. The improvement includes the alignment of the first and second detector tubes so that the diffracted X-rays travel the same distance thereto from the specimen in order to maintain a circle of focus.