Robert Horst

US Patent:

57151814, Feb 3, 1998

Filed:

Apr 3, 1995

Appl. No.:

8/415651

Inventors:

Robert L. Horst - Lancaster PA

International Classification:

G06F 1900

US Classification:

364554

Abstract:

A method is provided for process monitoring by statistical measurement of level-of-defectives performance in manufacturing and other processes. Statistical performance data functions of mean-value shift and deviation ratio are plotted on an isogrammetric chart for off-line analysis or, alternatively, are entered into a computer that has been programmed with the isogrammetric format. The resultant information revels the probable process yield and is useful to certify quality of performance in direct terms of level of defectives being produced. The method is particularly useful for high-yield processes where statistical sampling and inspection methods tend to miss the relatively few defectives and statistical process control (SPC) criteria appear to indicate that a manufacturing process is "in control".

US Patent:

43632718, Dec 14, 1982

Filed:

Sep 2, 1980

Appl. No.:

6/183004

Inventors:

Robert L. Horst - Lancaster PA

Assignee:

Armstrong World Industries, Inc. - Lancaster PA

International Classification:

B41F 1324

US Classification:

101181

Abstract:

A particular type of registration control mark is utilized with a conventional pattern registration control system for the purpose of controlling registration between a printed pattern and an embossed pattern. The pattern registration control mark will develop signature bursts which are unique due to the design of the pattern registration control mark.